Semiconductor storage device

ABSTRACT

A semiconductor storage device includes first and second wirings that are in a first layer above the substrate, extend along a first direction, and are adjacent to each other along a second direction, third and fourth wirings that are in a second layer above the first layer, extend along the second direction, and are adjacent to each other along the first direction, first and second memory cells on the first wiring, and a third memory cell on the second wiring. The first to third memory cells each include a variable resistance element and a switching element. The switching element of the first memory cell includes a gate coupled to the third wiring. The switching elements of the second and third memory cells each include a gate coupled to the fourth wiring. The variable resistance elements of the first to third memory cells are formed with equal distances from each other.

CROSS-REFERENCE TO RELATED APPLICATION

This application is based upon and claims the benefit of priority fromJapanese Patent Application No. 2017-054755, filed Mar. 21, 2017, theentire contents of which are incorporated herein by reference.

FIELD

Embodiments described herein relate generally to a semiconductor storagedevice.

BACKGROUND

A semiconductor storage device including a variable resistance elementis known.

DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram showing a configuration of a semiconductorstorage device according to a first embodiment.

FIG. 2 is a schematic diagram of a magnetic tunnel junction element ofthe semiconductor storage device according to the first embodiment.

FIG. 3 is a top view for describing a configuration of a memory cellarray of the semiconductor storage device according to the firstembodiment.

FIGS. 4A and 4B are sectional views for describing the configuration ofthe memory cell array of the semiconductor storage device according tothe first embodiment.

FIGS. 5A and 5B are sectional views for describing the configuration ofthe memory cell array of the semiconductor storage device according tothe first embodiment.

FIGS. 6A and 6B are sectional views for describing a configuration of amemory cell array of a semiconductor storage device according to amodification example of the first embodiment.

FIGS. 7A and 7B are sectional views for describing the configuration ofthe memory cell array of a semiconductor storage device according to themodification example of the first embodiment.

FIG. 8 is a top view for describing a configuration of a memory cellarray of a semiconductor storage device according to a secondembodiment.

FIGS. 9A and 9B are sectional views for describing the configuration ofthe memory cell array of the semiconductor storage device according tothe second embodiment.

FIGS. 10A and 10B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the second embodiment.

FIGS. 11A and 11B are sectional views for describing a configuration ofa memory cell array of a semiconductor storage device according to amodification example of the second embodiment.

FIGS. 12A and 11B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the modification example of the second embodiment.

FIG. 13 is a top view for describing a configuration of a memory cellarray of a semiconductor storage device according to a third embodiment.

FIGS. 14A and 14B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the third embodiment.

FIGS. 15A and 15B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the third embodiment.

FIGS. 16A and 15B are sectional views for describing a configuration ofa memory cell array of a semiconductor storage device according to amodification example of the third embodiment.

FIGS. 17A and 17B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the modification example of the third embodiment.

FIG. 18 is a top view for describing a configuration of a memory cellarray of a semiconductor storage device according to a fourthembodiment.

FIGS. 19A and 19B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the fourth embodiment.

FIGS. 20A and 20B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the fourth embodiment.

FIGS. 21A and 20B are sectional views for describing a configuration ofa memory cell array of a semiconductor storage device according to amodification example of the fourth embodiment.

FIGS. 22A and 22B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the modification example of the fourth embodiment.

FIG. 23 is a top view for describing a configuration of a memory cellarray of a semiconductor storage device according to a fifth embodiment.

FIGS. 24A and 24B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the fifth embodiment.

FIGS. 25A and 25B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the fifth embodiment.

FIGS. 26A and 26B are sectional views for describing a configuration ofa memory cell array of a semiconductor storage device according to amodification example of the fifth embodiment.

FIGS. 27A and 27B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the modification example of the fifth embodiment.

FIG. 28 is a top view for describing a configuration of a memory cellarray of a semiconductor storage device according to a sixth embodiment.

FIGS. 29A and 29B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the sixth embodiment.

FIGS. 30A and 30B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the sixth embodiment.

FIGS. 31A and 31B are sectional views for describing a configuration ofa memory cell array of a semiconductor storage device according to amodification example of the sixth embodiment.

FIGS. 32A and 32B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the modification example of the sixth embodiment.

FIG. 33 is a block diagram showing a configuration of a semiconductorstorage device according to a seventh embodiment.

FIG. 34 is a top view for describing a configuration of a memory cellarray of a semiconductor storage device according to a seventhembodiment.

FIGS. 35A and 35B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the seventh embodiment.

FIGS. 36A and 36B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the seventh embodiment.

FIG. 37 is a top view for describing a configuration of a memory cellarray of a semiconductor storage device according to an eighthembodiment.

FIGS. 38A and 38B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the eighth embodiment.

FIGS. 39A and 39B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the eighth embodiment.

FIG. 40 is a top view for describing a configuration of a memory cellarray of a semiconductor storage device according to a ninth embodiment.

FIGS. 41A and 41B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the ninth embodiment.

FIGS. 42A and 42B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the ninth embodiment.

FIG. 43 is a top view for describing a configuration of a memory cellarray of a semiconductor storage device according to a tenth embodiment.

FIGS. 44A and 44B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the tenth embodiment.

FIGS. 45A and 45B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the tenth embodiment.

FIG. 46 is a top view for describing a configuration of a memory cellarray of a semiconductor storage device according to an eleventhembodiment.

FIGS. 47A and 47B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the eleventh embodiment.

FIGS. 48A and 48B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the eleventh embodiment.

FIG. 49 is a top view for describing a configuration of a memory cellarray of a semiconductor storage device according to a twelfthembodiment.

FIGS. 50A and 50B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the twelfth embodiment.

FIGS. 51A and 51B are sectional views for describing the configurationof the memory cell array of the semiconductor storage device accordingto the twelfth embodiment.

FIG. 52 is a top view for describing a configuration of a memory cellarray of a semiconductor storage device according to a thirteenthembodiment.

FIG. 53 is a sectional view for describing the configuration of thememory cell array of the semiconductor storage device according to thethirteenth embodiment.

FIG. 54 is a sectional view for describing the configuration of thememory cell array of the semiconductor storage device according to thethirteenth embodiment.

FIGS. 55A and 55B are sectional views for describing a configuration ofa memory cell of a semiconductor storage device according to amodification example.

DETAILED DESCRIPTION

Embodiments provide a semiconductor storage device having memoryelements arranged such that distances between memory elements adjacentto each other are equal to each other while achieving an overallreduction in size of the semiconductor storage device.

In general, according to one embodiment, a semiconductor storage deviceincludes a substrate, a first wiring and a second wiring that are in afirst layer above the substrate, extend along a first direction that isparallel to a surface of the substrate, and are adjacent to each otheralong a second direction that intersects with the first direction and isparallel to the surface of the substrate, a third wiring and a fourthwiring that are in a second layer above the first layer, extend alongthe second direction, and are adjacent to each other along the firstdirection, a first memory cell and a second memory cell on a surface ofthe first wiring, and a third memory cell on a surface on the secondwiring. The first memory cell, the second memory cell, and the thirdmemory cell each include a variable resistance element and a switchingelement, the switching element of the first memory cell having a gatecoupled to the third wiring, and the switching element of the secondmemory cell and the switching element of the third memory cell eachhaving a gate coupled to the fourth wiring. The variable resistanceelement of the first memory cell, the variable resistance element of thesecond memory cell, and the variable resistance element of the thirdmemory cell are formed with equal distances from each other in a planeparallel to the surface of the substrate.

As used herein, a “switching element” is a transistor in someembodiments and a bi-direction switching element, also described hereinas a selector, in other embodiments.

Hereinafter, embodiments will be described with reference to thedrawings. In the following description, components having the samefunction and configuration will be assigned a common reference sign.When a plurality of components that are assigned a common reference signis to be distinguished from one another, the components aredistinguished by assigning suffixes to the common reference sign. Whenit is not necessary to distinguish between the plurality of components,only the common reference sign is assigned to the components.

1. First Embodiment

A semiconductor storage device according to a first embodiment will bedescribed. In the semiconductor storage device according to the firstembodiment, a magnetic storage device with perpendicular magnetizationusing a magnetic tunnel junction (MTJ) element as a memory element isdescribed as an example.

1.1 Configuration

Initially, a configuration of the semiconductor storage device accordingto the first embodiment will be described.

1.1.1. Configuration of Semiconductor Storage Device

FIG. 1 is a block diagram showing a configuration of a semiconductorstorage device 1 according to the first embodiment. As shown in FIG. 1,the semiconductor storage device 1 includes a memory cell array 11,write circuit and read circuit (WC/RC) 12, a row decoder 13, a pagebuffer 14, input and output circuit 15, and a control unit 16.

The memory cell array 11 includes a plurality of memory cells MCassociated with rows and columns. The memory cells MC present in thesame row are connected to the same word line WL, and ends of the memorycells MC present in the same column are connected to the same bit lineBL and the same source line SL, respectively.

The memory cell MC includes a select transistor ST and a magnetic tunneljunction element MTJ. For example, the select transistor ST includes afirst end connected to the bit line BL, a second end connected to thefirst end of the magnetic tunnel junction element MTJ, and a gateconnected the word line WL. The select transistor ST is provided as aswitch that controls the supply and stoppage of a current to themagnetic tunnel junction element MTJ. For example, the magnetic tunneljunction element MTJ includes a second end connected to the source lineSL. The magnetic tunnel junction element MTJ may switch between a lowresistance state and a high resistance state due to the flow of acurrent. The magnetic tunnel junction element MTJ is able to write datadepending on a change of the resistance state, and functions as avariable resistance element that is able to retain the written data in anon-volatile manner and from which the written data can be read.

The WC/RC 12 is connected to the bit line BL and the source line SL. TheWC/RC 12 supplies a current to the memory cell MC which is an operationtarget through the bit line BL and the source line SL, and writes andreads data to and from the memory cell MC. More specifically, the writecircuit of the WC/RC 12 writes data in the memory cell MC. For example,the write circuit includes a write driver and a current sink. The readcircuit of the WC/RC 12 reads data from the memory cell MC. For example,the read circuit includes a sense amplifier.

The row decoder 13 is connected to the memory cell array 11 through theword line WL. The row decoder 13 decodes a row address that designates arow of the memory cell array 11. The row decoder selects the word lineWL depending on the decoding result, and applies a voltage necessary toperform write and read operations of data to the selected word line WL.

The page buffer 14 temporarily retains data written in the memory cellarray 11 and data read from the memory cell array 11 for a data unitcalled a page.

The input and output circuit 15 transmits various signals received fromthe outside of the semiconductor storage device 1 to the control unit 16and the page buffer 14, and transmits various information items from thecontrol unit 16 and the page buffer 14 to the outside of thesemiconductor storage device 1.

The control unit 16 (which is a control circuit in one embodiment) isconnected to the WC/RC 12, the row decoder 13, the page buffer 14, andthe input and output circuit 15. The control unit 16 controls the WC/RC12, the row decoder 13, and the page buffer 14 according to varioussignals received by the input and output circuit 15 from the outside ofthe semiconductor storage device 1.

1.1.2. Configuration of Magnetic Tunnel Junction Element

Hereinafter, a configuration of the magnetic tunnel junction element ofthe semiconductor storage device according to the first embodiment willbe described with reference to FIG. 2. FIG. 2 is a schematic diagram fordescribing the configuration of the magnetic tunnel junction element ofthe semiconductor storage device according to the first embodiment.

As shown in FIG. 2, a memory element layer 20 functioning as themagnetic tunnel junction element MTJ includes a plurality of stackedfilms, and includes a current path through which a current flows in adirection perpendicular to a film surface. The memory element layer 20includes a ferromagnetic layer 21 functioning as a memory layer, anon-magnetic layer 22 functioning as a tunnel barrier layer, and aferromagnetic layer 23 functioning as a reference layer. For example,the memory element layer 20 is configured such that the ferromagneticlayer 21, the non-magnetic layer 22, and the ferromagnetic layer 23 aresequentially stacked. The magnetic tunnel junction element MTJ is aperpendicular magnetization MTJ element in which the magnetizationorientations of the ferromagnetic layers 21 and 23 face directionsperpendicular to the film surfaces thereof.

The ferromagnetic layer 21 is a ferromagnetic layer having a directionof easy magnetization that is perpendicular to the film surface, andcontains, for example, cobalt iron boron (CoFeB). The ferromagneticlayer 21 has a magnetization orientation facing any one of a directionof the select transistor ST and a direction of the ferromagnetic layer23. The magnetization property of the ferromagnetic layer 21 isdifferent from that of the ferromagnetic layer 23 such that themagnetization orientation of the ferromagnetic layer 21 is more easilyreversed than that of the ferromagnetic layer 23.

The non-magnetic layer 22 is a non-magnetic insulating film, andcontains, for example, magnesium oxide (MgO).

The ferromagnetic layer 23 is a ferromagnetic layer having a directionof easy magnetization that is perpendicular to a film surface, andcontains, for example, cobalt iron boron (CoFeb). The magnetizationorientation of the ferromagnetic layer 23 is fixed. The “magnetizationorientation is fixed” means that the magnetization orientation is notchanged due to a current having a magnitude enough to reverse themagnetization orientation of the ferromagnetic layer 21. Theferromagnetic layer 21, the non-magnetic layer 22, and the ferromagneticlayer 23 constitute magnetic tunnel junction.

The first embodiment adopts a spin injection writing method that employsa write current which directly flows to the magnetic tunnel junctionelement MTJ, and the magnetization orientation of the ferromagneticlayer 21 is controlled by the write current. The magnetic tunneljunction element MTJ may enter any one of the low resistance state andthe high resistance state depending on whether the magnetizationorientations of the ferromagnetic layer 21 and the ferromagnetic layer23 are parallel or anti-parallel.

When the write current flows to the magnetic tunnel junction element MTJin a direction of an arrow A1 in FIG. 2, that is, toward theferromagnetic layer 23 from the ferromagnetic layer 21, themagnetization orientations of the ferromagnetic layer 21 and theferromagnetic layer 23 become parallel. In a case where themagnetization orientations are parallel, the resistance of the magnetictunnel junction element MTJ is low, and the magnetic tunnel junctionelement MTJ is in the low resistance state. The low resistance state iscalled a “parallel (P) state”, and is defined, for example, as a stateof data “0”.

When the write current flows to the magnetic tunnel junction element MTJin a direction of an arrow A2 in FIG. 2, that is, toward theferromagnetic layer 21 from the ferromagnetic layer 23, themagnetization orientations of the ferromagnetic layer 21 and theferromagnetic layer 23 become anti-parallel. In a case where themagnetization orientations are anti-parallel, the resistance of themagnetic tunnel junction element MTJ is high, and the magnetic tunneljunction element MTJ is in the high resistance state. The highresistance state is called an “anti-parallel (AP) state”, and isdefined, for example, as a state of data “1”.

Although it will be described below that the method of defining the datais performed according to the above-described example, the method ofdefining data “1” and data “0” is not limited to the above-describedexample. For example, the P state may be defined as data “1”, and the APstate may be defined as data “0”.

1.1.3. Stacked Structure of Memory Cell Array

Hereinafter, a stacked structure of the memory cell array of thesemiconductor storage device according to the first embodiment will bedescribed. In the following description, it is assumed that a plane onwhich the bit line BL, the source line SL, and the word line WL extendis the xy-plane, and an axis perpendicular to the xy-plane is thez-axis. For example, the x-axis and the y-axis are defined as the axeswhich are perpendicular to each other in the xy-plane.

Initially, a layout of the memory cell array 11 in the xy-plane will bedescribed with reference to FIG. 3. FIG. 3 is a top view of the memorycell array 11 of the semiconductor storage device according to the firstembodiment when viewed in a +z-axis direction.

As shown in FIG. 3, a plurality of wiring layers 31 each functioning asthe source line SL extends, for example, along the x-axis direction(also referred to herein as a column direction), and is arranged alongthe y-axis direction (also referred to herein as a row direction) atequal intervals. In the example of FIG. 3, four wiring layers 31corresponding to an (m−1)-th-row source line SL(m−1), an m-th-row sourceline SLm, an (m+1)-th-row source line SL(m+1), and an (m+2)-th-rowsource line SL(m+2) are illustrated (where m is an arbitrary integer).Two wiring layers 31 adjacent to each other are separated from eachother along the y-axis direction by a distance d1. The “two elements areseparated from each other by a distance d along a certain direction”means that a distance between a center of a width of any one of the twoelements in the certain direction and a center of a width of the otherelement in the certain direction is separated along the certaindirection by the distance d.

A plurality of wiring layers 32 each functioning as the word line WL isformed above the wiring layers 31. For example, the wiring layers 32extend along the y-axis direction, and are arranged along the x-axisdirection at equal intervals. In the example of FIG. 3, four wiringlayers 32 corresponding to an (n−1)-th-column word line WL(n−1), ann-th-column word line WLn, an (n+1)-th-column word line WL(n+1), and an(n+2)-th-column word line WL(n+2) are illustrated (where n is anarbitrary integer). Two wiring layers 32 adjacent to each other areseparated from each other along the x-axis direction by a distance d2.The distance d2 is longer than the distance d1. A ratio (d1:d2) betweenthe distance d1 and the distance d2 is expressed, for example, by thefollowing expression.

d1:d2=√3/2:1

A plurality of wiring layers 33 each functioning as the bit line BL isformed above the wiring layers 32. For example, the wiring layers 33extend along the x-axis direction, and are arranged along the y-axisdirection at equal intervals. In the example of FIG. 3, four wiringlayers 33 corresponding to a (m−1)-th-row bit line BL(m−1), an m-th-rowbit line BLm, an (m+1)-th-row bit line BL(m+1), and an (m+2)-th-row bitline BL(m+2) are illustrated. Specifically, two wiring layers 33adjacent to each other are separated from each other along the y-axisdirection by the distance d1. Although a center of a width of the wiringlayer 33 along the y-axis direction matches a center of a width of thewiring layer 31 in the y-axis direction in the xy-plane in the exampleof FIG. 3, the present embodiment is not limited thereto.

In FIG. 3, a selection element layer 34 functioning as the selecttransistor ST is formed in a region in which the wiring layers 31 and 33intersect with the wiring layer 32. For example, the selection elementlayers 34 each have a cylindrical shape that extends along the z-axisdirection, and are formed between the wiring layers 31 and the wiringlayers 33. In the example of FIG. 3, a center of a circle (hereinafter,simply referred to as a “center” of the selection element layer 34)which is a section of the selection element 34 taken along the xy-plane,is located, for example, at an intersection of a central line of thewiring layer 31 or 33 on the x-axis direction and a central line of thewiring layer 32 along the y-axis direction. That is, the selectionelement layers 34 are arranged in a rectangular grid in the xy-plane.Specifically, the selection element layers 34 are arranged along thex-axis direction at equal intervals for every distance d2, and arearranged along the y-axis direction at equal intervals for everydistance d1. The selection element layers are arranged in this manner,and thus, the selection element layers 34 are formed one by one for thecombination of the wiring layers 31 and 33 in a certain row and thewiring layer 32 in a certain column.

In the following description, an element Y corresponding to thecombination of the m-th-row wiring layers 31 and 33 and the n-th-columnwiring layer 32 is described as an element Y(m, n) for simplicity ofdescription.

In FIG. 3, the memory element layers 20 are formed such that at leastsome thereof overlap in regions occupied by the selection element layers34. For example, the memory element layers 20 each have a cylindricalshape that extends along the z-axis direction, and are formed betweenthe wiring layers 31 and the wiring layers 33.

The memory element layers 20 are arranged in a honeycomb shape in thexy-plane. Specifically, the memory element layers 20 are arranged inpositions of vertices and a center of a regular hexagon of which alength of one side is the distance d2 in the xy-plane. Morespecifically, the memory element layers 20 are arranged along the x-axisdirection at equal intervals for every distance d2, and are arrangedalong the y-axis direction at equal intervals for every distance 2 d 1.That is, an (m−1)-th-row memory element layer 20 and an (m+1)-th-rowmemory element layer 20 are aligned in the y-axis direction. An m-th-rowmemory element layer 20 and an (m+2)-th-row memory element layer 20 arealigned in the y-axis direction. However, the m-th-row memory elementlayer 20 and the (m−1)-th-row memory element layer 20 are not aligned inthe y-axis direction, and the m-th-row memory element layer 20 and the(m+1)-th-row memory element layer 20 are not aligned in the y-axisdirection.

In the example of FIG. 3, a center of a circle which is a section of them-th-row memory element layer 20 taken along the xy-plane (hereinafter,simply referred to as a “center” of the memory element layer 20) islocated in a position offset from a center of a width of thecorresponding wiring layer 32 along the x-axis direction in the +x-axisdirection. Centers of the (m−1)-th-row and (m+1)-th-row memory elementlayers 20 are located in positions offset from the center of the widthof the corresponding wiring layer 32 along the x-axis direction in the−x-axis direction. The center of the m-th-row memory element layer 20 islocated in a position offset from the centers of the (m−1)-th-row and(m+1)-th-row memory element layers 20 along the x-axis direction by adistance d2/2.

The memory element layers are arranged in this manner, and thus, thememory element layers 20 are formed so as to correspond to the selectionelement layers 34, and are formed one by one for the combination of thewiring layers 31 and 33 in a certain row and the wiring layer 32 in acertain column. An arbitrary memory element layer 20 is disposed withequal distances from six memory element layers 20 adjacent to thearbitrary memory element layer 20 in the xy-plane. Specifically, sixmemory element layers 20(m, n−1), 20(m, n+1), 20(m−1, n), 20(m−1, n+1),20(m+1, n), and 20(m+1, n+1) adjacent to the memory element layer 20(m,n) are arranged in the vertices of the regular hexagon of which one sideis the distance d2, and the memory element layer 20(m, n) is disposed inthe center of the regular hexagon. As another example, six memoryelement layers 20(m+1, n−1), 20(m+1, n+1), 20(m, n−1), 20(m, n), 20(m+2,n−1), and 20(m+2, n) adjacent to the memory element layer 20(m+1, n) arearranged in the vertices of the regular hexagon of which one side is thedistance d2, and the memory element layer 20(m+1, n) is disposed in thecenter of the regular hexagon.

Hereinafter, configurations of sections of the memory cell array 11described in FIG. 3 which are taken along the xz-plane and the yz-planewill be described with reference to FIGS. 4A to 5B. FIGS. 4A to 5B areexamples of sectional views of the stacked structure of the memory cellarray of the semiconductor storage device according to the firstembodiment, which are taken along the xz-plane and the yz-plane.Specifically, FIGS. 4A to 5B are sections which are respectively takenalong a line IVA-IVA, a line IVB-IVB, a line VA-VA, and a line VB-VBshown in FIG. 3. In FIGS. 4A to 5B, some insulating layers are omittedfor simplicity of illustration.

Initially, the configuration of the section of the memory cell array 11taken along the xz-plane will be described with reference to FIGS. 4Aand 4B.

As shown in FIGS. 4A and 4B, on the semiconductor substrate 30, thewiring layer 31 functioning as the source line SL(m−1) is formed in thesection taken along the line IVA-IVA, and the wiring layer 31functioning as the source line SLm is formed in the section taken alongthe line IVB-IVB. The wiring layer 31 is commonly connected to theone-side ends of the select transistors ST of the plurality of memorycells MC arranged along the x-axis direction.

The plurality of wiring layers 32 functioning as the word lines WL(n−1),WLn, WL(n+1), and WL(n+2) is formed in the same layer above the wiringlayers 31 at equal intervals for every distance d2. An insulating film(not shown) is formed between the wiring layers 31 and 32, between theplurality of wiring layers 32, and on top surfaces of the wiring layers32.

First regions R1 are respectively formed in a plurality of regions inwhich the select transistors ST are formed. The first regions R1 areformed along the x-axis direction so as to be separated from one anotherby the distance d2. The first regions R1 are in contact with one of theplurality of wiring layers 32, and reach the wiring layers 31. Aninsulating layer 35 functioning as a block insulating film is formed onside surfaces of the first region R1. The selection element layer 34including a semiconductor layer is formed within the first region R1.The selection element layer 34 includes a diffusion layer 41, a channellayer 42, and a diffusion layer 43. For example, the diffusion layer 41,the channel layer 42, and the diffusion layer 43 are sequentiallystacked on the wiring layer 31. The channel layer 42 is formed in thesame layer as that of the wiring layer 32. Accordingly, the wiring layer32 functions as the gate of the select transistor ST formed within thefirst region R1 in contact with the wiring layer 32, and the channellayer 42 functions as a channel of the select transistor ST. Thediffusion layers 41 and 43 include carriers, and function respectivelyas source and drain of the select transistor ST. For example, the selecttransistor ST functions as a vertical transistor including a currentpath along the z-axis direction.

Second regions R2 are respectively formed in a plurality of regions inwhich the magnetic tunnel junction elements MTJ are formed. The secondregions R2 are formed along the x-axis direction so as to be separatedfrom one another by the distance d2. Each second region R2 reaches apart of the upper end of the diffusion layer 43. A conductive layer 44,the memory element layer 20, and a conductive layer 45 are sequentiallystacked within the second region R2. The conductive layers 44 and 45function as a lower electrode and an upper electrode of the magnetictunnel junction element MTJ, respectively. Accordingly, a one-side endof the magnetic tunnel junction element MTJ and the other-side end ofthe select transistor ST are connected to each other.

In a layer on an upper end of the conductive layer 45, the wiring layer33 functioning as the bit line BL(m−1) is formed in the section takenalong the line IVA-IVA, and the wiring layer 33 functioning as the bitline BLm is formed in the section taken along the line IVB-IVB. Thewiring layer 33 is commonly connected to the other-side ends of themagnetic tunnel junction elements MTJ of the plurality of memory cellsMC arranged along the x-axis direction.

The second region R2 is formed so as to be offset from the first regionR1 in the x-axis direction while maintaining a state in which theconductive layer 44 is electrically connected to the diffusion layer 43.Specifically, the second region R2 is formed so as to be offset from thefirst region R1 in the −x-axis direction in the section taken along theline IVA-IVA, and is formed as to be offset from the first region R1 inthe +x-axis direction in the section taken along the line IVB-IVB. Thesecond region R2 in the section taken along the line IVA-IVA and thesecond region R2 in the section taken along the line IVB-IVB are formedso as to be offset from each other along the x-axis direction by thedistance d2/2.

Hereinafter, the configuration of the section of the memory cell array11 taken along the yz-plane will be described with reference to FIGS. 5Aand 5B.

As shown in FIGS. 5A and 5B, the plurality of wiring layers 31functioning as the plurality of source lines SL(m+2), SL(m+1), SLm, andSL(m−1) is formed on the semiconductor substrate 30 at equal intervalsfor every distance d1. The wiring layer 32 functioning as the word lineWL(n−1) is formed above the wiring layer 31.

The first regions R1 are formed along the y-axis direction so as to beseparated from one another by the distance d1. A center of a width ofthe first region R1 along the y-axis direction matches a center of awidth of the wiring layer 31 formed immediately under the first regionR1 along the y-axis direction. The select transistor ST having the sameconfiguration as that of the select transistor ST described in FIGS. 4Aand 4B is formed in the first region R1. The plurality of selecttransistors ST formed along the y-axis direction is commonly connectedto the same wiring layer 32.

The second regions R2 are formed along the y-axis direction so as to beseparated from one another by the distance 2 d 1. Specifically, thesecond regions R2 are formed above the wiring layers 31 functioning asthe source lines SL(m+2) and SLm in the section taken along the lineVA-VA. The second regions R2 are formed above the wiring layers 31functioning as the source lines SL(m+1) and SL(m−1) in the section takenalong the line VB-VB. The second regions R2 in the section taken alongthe line VA-VA and the second regions R2 in the section taken along theline VB-VB are formed along the y-axis direction so as to be separatedfrom each other by the distance d1. A center of a width of the secondregion R2 along the y-axis direction matches centers of widths of thefirst region R1 formed immediately under the second region R2 and thewiring layer 31 along the y-axis direction. The magnetic tunnel junctionelement MTJ having the same configuration as that of the magnetic tunneljunction element MTJ described in FIGS. 4A and 4B is formed in thesecond region R2.

The plurality of wiring layers 33 functioning as the bit lines BL(m+2),BL(m+1), BLm, and BL(m−1) is formed in the layer on the upper end of theconductive layer 45 at equal intervals for every distance d1. The wiringlayers 33 functioning as the bit lines BL(m+2) and BLm are respectivelyconnected to the conductive layers 45 in the section taken along theline VA-VA, and the wiring layers 33 functioning as the bit linesBL(m+1) and BL(m−1) are connected to the conductive layers 45 in thesection taken along the line VB-VB. A center of a width of the wiringlayer 33 along the y-axis direction matches centers of widths of thesecond region R2, the first region R1, and the wiring layer 31 formedimmediately under the wiring layer 33 along the y-axis direction.

1.2 Advantage According to Present Embodiment

According to the first embodiment, it is possible to set the distancesbetween the adjacent memory elements to be at equal intervals whilereducing a cell size. The present advantage will be described below.

The select transistor ST of the semiconductor storage device accordingto the first embodiment is the vertical transistor. Specifically, theselect transistor ST is configured such that the diffusion layer 41, thechannel layer 42, and the diffusion layer 43 are sequentially stackedalong the z-axis direction. The wiring layer 32 is formed in the samelayer as that of the channel layer 42. Accordingly, the wiring layer 32is formed between the wiring layers 31 and 33. In other words, thewiring layer 32 is formed above the wiring layer 31 and under the wiringlayer 33. Thus, the current path of the select transistor ST does notfollow the xy-plane and can follow the z-axis direction, unlike a planartransistor. With the select transistor ST having a verticalconfiguration, the memory cell array 11 can be formed with a size (forexample, 4F2 size) that is denser than a size (for example, 6F2 size) ofthe memory cell using the planar transistor.

The magnetic tunnel junction elements MTJ are arranged in the verticesand the center of the regular hexagon in the xy-plane. Specifically, themagnetic tunnel junction elements MTJ which correspond to thecombination of the same bit line BL and the same source line SL and areadjacent to each other are separated from each other along the x-axisdirection by the distance d2. The magnetic tunnel junction elements MTJwhich correspond to the same word line WL and are adjacent to each otherare separated from each other along the y-axis direction by the distanced1. The magnetic tunnel junction elements MTJ which correspond to thecombination of the bit line BL and the source line SL in the m-th rowand correspond to the n-th-column word line WL and the magnetic tunneljunction elements MTJ which correspond to the combination of the bitline BL and the source line SL in the (m+1)-th row and correspond to then-th-column word line WL are separated from each other along the x-axisdirection by the distance d2/2. Accordingly, it is possible to set thedistances between all the magnetic tunnel junction elements MTJ adjacentto each other to be equal.

For example, an area necessary to arrange a certain number of memorycells MC according to the present embodiment is about 0.87 times of anarea necessary when the memory cells are arranged in the rectangulargrid. Thus, it is possible to acquire a memory cell array having asmaller area. When the arrangement of the memory cells MC according tothe present embodiment is applied to the same area as that of the memorycells arranged in the rectangular grid, it is possible to arrange thesame number of memory cells MC in wider intervals. Accordingly, it ispossible to arrange the memory cells in a shape in which interferencebetween the memory cells MC is reduced.

1.3 Modification Example of First Embodiment

Although the semiconductor storage device according to the firstembodiment in which the magnetic tunnel junction element MTJ is formedabove the select transistor ST is described, the present embodiment isnot limited thereto. For example, the magnetic tunnel junction elementMTJ may be formed under the select transistor ST.

FIGS. 6A to 7B are examples of sectional views of a stacked structure ofa memory cell array of a semiconductor storage device according to amodification example of the first embodiment, which are taken along thexz-plane and the yz-plane. Specifically, FIGS. 6A to 7B show sectionswhich are respectively taken along the line IVA-IVA, the line IVB-IVB,the line VA-VA, and the line VB-VB shown in FIG. 3, and correspond toFIGS. 4A to 5B.

As shown in FIGS. 6A to 7B, the magnetic tunnel junction element MTJ isformed on the wiring layer 31, the select transistor ST is formed on themagnetic tunnel junction element MTJ, and the wiring layer 33 is formedon the select transistor ST.

The magnetic tunnel junction element MTJ and the select transistor STshown in FIGS. 6A to 7B are merely substituted for the magnetic tunneljunction element MTJ and the select transistor ST shown in FIGS. 4A to5B in the z-axis direction, and the positional relation therebetween inthe xy-plane is not changed.

With such a configuration, even when the select transistor ST is formedon the magnetic tunnel junction element MTJ, it is possible to acquirethe same advantage as that of the first embodiment.

2. Second Embodiment

Hereinafter, a semiconductor storage device according to a secondembodiment will be described. The magnetic tunnel junction element isoffset from the select transistor along the x-axis direction in thefirst embodiment, whereas the magnetic tunnel junction element is offsetfrom the select transistor along the y-axis direction in the secondembodiment. Hereinafter, differences from the first embodiment will bedescribed.

2.1 Stacked Structure of Memory Cell Array

A stacked structure of a memory cell array of the semiconductor storagedevice according to a second embodiment will be described below.

Initially, a layout of the memory cell array 11 in the xy-plane will bedescribed with reference to FIG. 8. FIG. 8 is a top view of the memorycell array 11 of the semiconductor storage device according to thesecond embodiment when viewed in the +z-axis direction.

As shown in FIG. 8, two wiring layers 31 adjacent to each other areseparated from each other along the y-axis direction by the distance d2.Two wiring layers 32 adjacent to each other are separated from eachother along the x-axis direction by the distance d1. Two wiring layers33 adjacent to each other are separated from each other along the y-axisdirection by the distance d2. In the example of FIG. 8, a center of awidth of the wiring layer 33 along the y-axis direction matches, forexample, a center of a width of the wiring layer 31 along the y-axisdirection in the xy-plane, and the present embodiment is not limitedthereto.

Selection element layers 34 are arranged in a rectangular grid in thexy-plane. Specifically, the selection element layers 34 are arranged,for example, along the x-axis direction at equal intervals for everydistance d1, and are arranged along the y-axis direction at equalintervals for every distance d2.

Memory element layers 20 are disposed in a honeycomb shape in thexy-plane. Specifically, the memory element layers 20 are arranged in aposition of vertices and a center of a regular hexagon of which a lengthof one side is the distance d2 in the xy-plane. More specifically, thememory element layers 20 are arranged along the y-axis direction atequal intervals for every distance d2, and are arranged along the x-axisdirection at equal intervals for every distance 2 d 1. That is, an(n−1)-th-column memory element layer 20 and an (n+1)-th-column memoryelement layer 20 are aligned in the x-axis direction. An n-th-columnmemory element layer 20 and an (n+2)-th-column memory element layer 20are aligned in the x-axis direction. However, the n-th-column memoryelement layer 20, and the (n−1)-th-column memory element layer 20 arenot aligned in the x-axis direction, and the n-th-column memory elementlayer 20 and the (n+1)-th-column memory element layer 20 are not alignedin the x-axis direction.

In the example of FIG. 8, a center of the n-th-column memory elementlayer 20 is located in a position, which is offset from a center of awidth of the combination of the corresponding wiring layers 31 and 33along the y-axis direction, in the −y-axis direction. Centers of the(n−1)-th-column and (n+1)-th-column memory element layers 20 are locatedin positions, which are offset from a center of a width of thecombination of the corresponding wiring layers 31 and 33 along they-axis direction, in the +y-axis direction. As a result, the center ofthe n-th-column memory element layer 20 is located in a position offsetfrom the centers of the (n−1)-th-column and (n+1)-th-column memoryelement layers 20, along the y-axis direction by the distance d2/2.

The memory element layers are arranged in this manner, and thus, anarbitrary memory element layer 20 is disposed with equal distances fromsix memory element layers 20 adjacent to the arbitrary memory elementlayer 20 in the xy-plane. Specifically, for example, six memory elementlayers 20(m−1, n), 20(m+1, n), 20(m, n−1), 20(m+1, n−1), 20(m, n+1), and20(m+1, n+1), n+1) adjacent to a memory element layer 20(m, n) arearranged in the vertices of the regular hexagon of which one side is thedistance d2, and the memory element layer 20(m, n) is disposed in thecenter of the regular hexagon. As another example, six memory elementlayers 20(m−1, n+1), 20(m+1, n+1), 20(m−1, n), 20(m, n), 20(m−1, n+2),and 20(m, n+2) adjacent to the memory element layer 20(m, n+1) arearranged in the vertices of the regular hexagon of which one side is thedistance d2, and the memory element layer 20(m, n+1) is disposed in thecenter of the regular hexagon.

Hereinafter, configurations of sections of the memory cell array 11described in FIG. 8 which are taken along the xz-plane and the yz-planewill be described with reference to FIGS. 9A to 10B. FIGS. 9A to 10B areexamples of sectional views of a stacked structure of the memory cellarray of the semiconductor storage device according to the secondembodiment, which are taken along the xz-plane and the yz-plane.Specifically, FIGS. 9A to 10B show sections taken along a line IXA-IXA,a line IXB-IXB, a line XA-XA, and a line XB-XB shown in FIG. 8. In thefollowing description, differences between FIGS. 9A to 10B and FIGS. 4Ato 5B will be described.

Initially, the configuration of the section of the memory cell array 11taken along the xz-plane will be described with reference to FIGS. 9Aand 9B.

As shown in FIGS. 9A and 9B, the plurality of wiring layers 32functioning as the word lines WL(n−1), WLn, WL(n+1), and WL(n+2) isformed in the same layer above the wiring layer 31 at equal intervalsfor every distance d1.

First regions R1 are formed along the x-axis direction so as to beseparated from one another by the distance d1. The first regions R1 arein contact with one of the plurality of wiring layers 32, and reach thewiring layers 31. The select transistor ST having the same configurationas that of the select transistor ST described in the above-describedembodiment is formed in the first region R1.

Second regions R2 are formed along the x-axis direction so as to beseparated from each other by the distance 2 d 1. Specifically, thesecond regions R2 are formed above the wiring layers 32 functioning asthe word lines WL(n−1) and WL(n+1) in the section taken along the lineIXA-IXA. The second regions R2 are formed above the wiring layers 32functioning as the word lines WLn and WL(n+2) in the section taken alongthe line IXB-IXB. The second region R2 in the section taken along theline IXA-IXA and the second region R2 in the section taken along theline IXB-IXB are formed along the x-axis direction so as to be separatedfrom each other by the distance d1. A center of a width of the secondregion R2 along the x-axis direction matches a center of a width of thefirst region R1 formed immediately under the second region R2 along thex-axis direction. The magnetic tunnel junction element MTJ having thesame configuration as that of the magnetic tunnel junction element MTJdescribed in the above-described embodiment is formed in the secondregion R2.

Hereinafter, the configuration of the section of the memory cell array11 taken along the yz-plane will be described with reference to FIGS.10A and 10B.

As shown in FIGS. 10A and 10B, the plurality of wiring layers 31functioning as the plurality of source lines SL(m+2), SL(m+1), SLm, andSL(m−1) is formed on the semiconductor substrate 30 at equal intervalsfor every distance d2. Above the wiring layer 31, the wiring layer 32functioning as the word line WL(n−1) is formed in the section takenalong the line XA-XA, and the wiring layer 32 functioning as the wordline WLn in the section taken along the line XB-XB.

The first regions R1 are formed along the y-axis direction so as to beseparated from one another by the distance d2. A center of a width ofthe first region R1 along the y-axis direction matches a center of awidth of the wiring layer 31 formed immediately under the first regionR1 along the y-axis direction. The select transistor ST having the sameconfiguration as that of the select transistor ST described in theabove-described embodiment is formed in the first region R1.

The second regions R2 are formed along the y-axis direction so as to beseparated from one another by the distance d2. The second region R2 isformed so as to be offset from the first region R1 in the y-axisdirection while maintaining a state in which the conductive layer 44 iselectrically connected to the diffusion layer 43. Specifically, thesecond region R2 is formed so as to be offset from the first region R1in the +y-axis direction in the section taken along the line XA-XA, andis formed so as to be offset from the first region R1 in the −y-axisdirection in the section taken along the line XB-XB. The second regionR2 in the section taken along the line XA-XA and the second region R2 inthe section taken along the line XB-XB are formed along the x-axisdirection so as to be offset from each other along the x-axis directionby the distance d2/2. The magnetic tunnel junction element MTJ havingthe same configuration as that of the magnetic tunnel junction elementMTJ described in the above-described embodiment is formed in the secondregion R2.

The plurality of wiring layers 33 functioning as the bit lines BL(m+2),BL(m+1), BLm, and BL(m−1) is formed on an upper end of the conductivelayer 45 at equal intervals by the distance d2. A center of a width ofthe wiring layer 33 along the y-axis direction matches centers of widthsof the first region R1 and the wiring layer 31 formed immediately underthe wiring layer 33 along the y-axis direction.

2.2 Advantage According to Present Embodiment

According to the second embodiment, the magnetic tunnel junctionelements MTJ are disposed in the vertices and the center of the regularhexagon in the xy-plane. Specifically, the magnetic tunnel junctionelements MTJ which correspond to the same word line WL and are adjacentto each other are separated from each other along the y-axis directionby the distance d2. The magnetic tunnel junction elements MTJ whichcorrespond to the combination of the same bit line BL and the samesource line SL and are adjacent to each other are separated from eachother along the x-axis direction by the distance d1. The magnetic tunneljunction elements MTJ which correspond to the combination of the bitline BL and the source line SL in the m-th row and correspond to then-th-column word line WL and the magnetic tunnel junction elements MTJwhich correspond to the combination of the bit line BL and the sourceline SL in the m-th row and correspond to the (n+1)-th-column word lineWL are separated from each other along the y-axis direction by thedistance d2/2. Accordingly, it is possible to set the distances betweenall the magnetic tunnel junction elements MTJ adjacent to each other tobe equal. Thus, a manufacturing fluctuation in a manufacturing stage canbe reduced in the embodiment compared to the arrangement in which thedistances between all the magnetic tunnel junction elements adjacent toeach other are not equal, such as in the case of the memory cellsarranged in the rectangular grid.

In addition, according to the second embodiment, it is possible tosimilarly acquire other advantages mentioned in the first embodiment.

2.3 Modification Example of Second Embodiment

Although the semiconductor storage device according to the secondembodiment in which the magnetic tunnel junction element MTJ is formedabove the select transistor ST is described, the present embodiment isnot limited thereto. For example, the magnetic tunnel junction elementMTJ may be formed under the select transistor ST.

FIGS. 11A to 12B are examples of sectional views of a stacked structureof a memory cell array of a semiconductor storage device according to amodification example of the second embodiment, which are taken along thexz-plane and the yz-plane. Specifically, FIGS. 11A to 12B show sectionstaken along the line IXA-IXA, the line IXB-IXB, the line XA-XA, and theline XB-XB shown in FIG. 8, and correspond to FIGS. 9A to 10B.

As shown in FIGS. 11A to 12B, the magnetic tunnel junction element MTJis formed on the wiring layer 31, the select transistor ST is formed onthe magnetic tunnel junction element MTJ, and the wiring layer 33 isformed on the select transistor ST.

The magnetic tunnel junction element MTJ and the select transistor STshown in FIGS. 11A to 12B are merely substituted for the magnetic tunneljunction element MTJ and the select transistor ST shown in FIGS. 9A to10B in the z-axis direction, and the positional relation therebetween inthe xy-plane is not changed.

With such a configuration, even when the select transistor ST is formedon the magnetic tunnel junction element MTJ, it is possible to acquirethe same advantage as that of the second embodiment.

3. Third Embodiment

Hereinafter, a semiconductor storage device according to a thirdembodiment will be described. The select transistors are arranged in therectangular grid in the first embodiment and the second embodiment,whereas the select transistors are arranged in a honeycomb shape in thethird embodiment. In the third embodiment, the select transistors arearranged similarly to the arrangement of the magnetic tunnel junctionelements described in the first embodiment. That is, in the thirdembodiment, a center of the select transistor in the xy-plane matches acenter of the magnetic tunnel junction element. Hereinafter, differencesfrom the first embodiment will be described.

3.1 Stacked Structure of Memory Cell Array

A stacked structure of a memory cell array of a semiconductor storagedevice according to the third embodiment will be described below.

Initially, a layout of the memory cell array 11 in the xy-plane will bedescribed with reference to FIG. 13. FIG. 13 is a top view of the memorycell array 11 of the semiconductor storage device according to the thirdembodiment when viewed in the +z-axis direction.

As shown in FIG. 13, the arrangement of the wiring layers 31 to 33 andthe memory element layers 20 is the same as that of the firstembodiment, and thus, the description is omitted.

The selection element layers 34 are arranged in the honeycomb shape inthe xy-plane. Specifically, the selection element layers 34 are arrangedin vertices and a center of a regular hexagon of which a length of oneside is the distance d2 in the xy-plane. More specifically, theselection element layers 34 are arranged along the x-axis direction atequal intervals for every distance d2, and are arranged along the y-axisdirection at equal intervals for every distance 2 d 1. That is, an(m−1)-th-row selection element layer 34 and an (m+1)-th-row selectionelement layer 34 are aligned in the y-axis direction. An m-th-rowselection element layer 34 and an (m+2)-th-row selection element layer34 are aligned in the y-axis direction. However, the m-th-row selectionelement layer 34 and the (m−1)-th-row selection element layer 34, andthe m-th-row selection element layer 34 and the (m+1)-th-row selectionelement layer 34 are not aligned in the y-axis direction.

In the example of FIG. 13, a center of the m-th-row selection elementlayer 34 is disposed so as to match a center of the memory element layer20 in the xy-plane. That is, a center of the m-th-row selection elementlayer 34 is located in a position offset from centers of the(m−1)-th-row and (m+1)-th-row selection element layers 34 along thex-axis direction by the distance d2/2.

The selection element layers are arranged in this manner, and thus, anarbitrary selection element layer 34 is disposed with equal distancesfrom six selection element layers 34 adjacent to the arbitrary selectionelement layer 34 in the xy-plane. Specifically, for example, sixselection element layers 34(m, n−1), 34(m, n+1), 34(m−1, n), 34(m−1,n+1), 34(m+1, n), and 34(m+1, n+1) adjacent to the selection elementlayer 34(m, n) are arranged in the vertices of the regular hexagon ofwhich one side is the distance d2, and the selection element layer 34(m,n) is disposed in the center of the regular hexagon. As another example,six selection element layers 34(m+1, n−1), 34(m+1, n+1), 34(m, n−1),34(m, n), 34(m+2, n−1), and 34(m+2, n) adjacent to the selection elementlayer 34(m+1, n) are arranged in the vertices of the regular hexagon ofwhich one side is the distance d2, and the selection element layer34(m+1, n) is disposed in the center of the regular hexagon.

Hereinafter, configurations of sections of the memory cell array 11described in FIG. 13 which are taken along the xz-plane and the yz-planewill be described with reference to FIGS. 14A to 15B. FIGS. 14A to 15Bare examples of sectional views of a stacked structure of the memorycell array of the semiconductor storage device according to the thirdembodiment, which are taken along the xz-plane and the yz-plane.Specifically, FIGS. 14A to 15B show sections taken along a lineXIVA-XIVA, a line XIVB-XIVB, a line XVA-XVA, and a line XVB-XVB shown inFIG. 13. In the following description, differences between FIGS. 14A to15B and FIGS. 4A to 5B will be described.

Initially, the configuration of the section of the memory cell array 11taken along the xz-plane will be described with reference to FIGS. 14Aand 14B.

As shown in FIGS. 14A and 14B, the first region R1 is formed so as to bein contact with a part of the wiring layer 32. Specifically, the firstregion R1 is in contact with a part of the wiring layer 32 on the−x-axis in the section taken along the line XIVA-XIVA, and is in contactwith a part of the wiring layer 32 on the +x-axis in the section takenalong the line XIVB-XIVB. A center of a width of the first region R1along the x-axis direction matches a center of a width of the secondregion R2 formed immediately above the first region R1 along the x-axisdirection.

That is, the combination of the first region R1 and the second region R2is formed so as to be offset from the wiring layer 32 in the −x-axisdirection in the section taken along the line XIVA-XIVA, and is formedso as to be offset from the wiring layer 32 in the +x-axis direction inthe section taken along the line XIVB-XIVB. The combination of the firstregion R1 and the second region R2 in the section taken along the lineXIVA-XIVA and the combination of the first region R1 and the secondregion R2 in the section taken along the line XIVB-XIVB are formed so asto be offset from each other along the x-axis direction by the distanced2/2.

Hereinafter, the configuration of the section of the memory cell array11 taken along the yz-plane will be described with reference to FIGS.15A and 15B.

As shown in FIGS. 15A and 15B, the first regions R1 are formed along they-axis direction so as to be separated from one another by the distance2 d 1. Specifically, the first regions R1 are formed above the wiringlayers 31 functioning as the source lines SL(m+2) and SLm in the sectiontaken along the line XVA-XVA. The first regions R1 are formed above thewiring layers 31 functioning as the source lines SL(m+1) and SL(m−1) inthe section taken along the line XVB-XVB. The first region R1 in thesection taken along the line XVA-XVA and the first region R1 in thesection taken along the line XVB-XVB are formed along the y-axisdirection so as to be separated from each other by the distance d1.

3.2 Advantage According to Present Embodiment

According to the third embodiment, the select transistors ST aredisposed in the vertices and the center of the regular hexagon in thexy-plane. Specifically, the select transistors ST which correspond tothe combination of the same bit line BL and the same source line SL andare adjacent to each other are separated from each other along thex-axis direction by the distance d2. The select transistors ST whichcorrespond to the same word line WL and are adjacent to each other areseparated from each other along the y-axis direction by the distance d1.The select transistors ST which correspond to the combination of the bitline BL and the source line SL in the m-th row and correspond to then-th-column word line WL and the select transistors ST which correspondto the combination of the bit line BL and the source line SL in the(m+1)-th row and correspond to the n-th-column word line WL areseparated from each other along the x-axis direction by the distanced2/2. Accordingly, it is possible to set the distances between all theselect transistors ST adjacent to each other to be equal. Thus, it ispossible to reduce a manufacturing fluctuation in a manufacturing stage.

A center of the select transistor ST matches a center of the magnetictunnel junction element MTJ in the xy-plane. Accordingly, it is possibleto increase a contact area between the select transistor ST and themagnetic tunnel junction element MTJ. It is possible to further reducean area occupied by the memory cell in the xy-plane.

In addition, according to the third embodiment, it is possible tosimilarly acquire other advantages mentioned in the first embodiment.

3.3 Modification Example of Third Embodiment

Although the semiconductor storage device according to the thirdembodiment in which the magnetic tunnel junction element MTJ is formedabove the select transistor ST is described, the present embodiment isnot limited thereto. For example, the magnetic tunnel junction elementMTJ may be formed under the select transistor ST.

FIGS. 16A to 17B are examples of sectional views of a stacked structureof a memory cell array of a semiconductor storage device according to amodification example of the third embodiment, which are taken along thexz-plane and the yz-plane. Specifically, FIGS. 16A to 17B show sectionstaken along the line XIVA-XIVA, the line XIVB-XIVB, the line XVA-XVA,and the line XVB-XVB shown in FIG. 13, and correspond to FIGS. 14A to15B.

As shown in FIGS. 16A to 17B, the magnetic tunnel junction element MTJis formed on the wiring layer 31, the select transistor ST is formed onthe magnetic tunnel junction element MTJ, and the wiring layer 33 isformed on the select transistor ST.

The magnetic tunnel junction element MTJ and the select transistor STshown in FIGS. 16A to 17B are merely substituted for the magnetic tunneljunction element MTJ and the select transistor ST shown in FIGS. 14A to15B in the z-axis direction, and the positional relation therebetween inthe xy-plane is not changed.

With such a configuration, even when the select transistor ST is formedon the magnetic tunnel junction element MTJ, it is possible to acquirethe same advantage as that of the third embodiment.

4. Fourth Embodiment

Hereinafter, a semiconductor storage device according to a fourthembodiment will be described. In the fourth embodiment, the fourthembodiment is different from the first embodiment and the secondembodiment in that the select transistors are arranged in the honeycombshape, similarly to the third embodiment. In the fourth embodiment, theselect transistors are arranged similarly to the arrangement of themagnetic tunnel junction elements described in the second embodiment.That is, in the fourth embodiment, the select transistors are arrangedtogether with the magnetic tunnel junction elements along the y-axisdirection, and a central position of the select transistor matches acenter of the magnetic tunnel junction element in the xy-plane.Hereinafter, differences from the second embodiment will be described.

4.1 Stacked Structure of Memory Cell Array

A stacked structure of a memory cell array of the semiconductor storagedevice according to the fourth embodiment will be described below.

Initially, a layout of the memory cell array 11 in the xy-plane will bedescribed with reference to FIG. 18. FIG. 18 is a top view of the memorycell array 11 of the semiconductor storage device according to thefourth embodiment when viewed in the +z-axis direction.

As shown in FIG. 18, the arrangement of the wiring layers 31 to 33 andthe memory element layers 20 is the same as that of the secondembodiment, and thus, the description is omitted.

The selection element layers 34 are arranged in the honeycomb shape inthe xy-plane. Specifically, the selection element layers 34 are arrangedin vertices and a center of a regular hexagon of which a length of oneside is the distance d2 in the xy-plane. More specifically, theselection element layers 34 are arranged along the y-axis direction atequal intervals for every distance d2, and are arranged along the x-axisdirection at equal intervals for every distance 2 d 1. That is, the(n−1)-th-column selection element layer 34 and the (n+1)-th-columnselection element layer 34 are aligned in the x-axis direction. Then-th-column selection element layer 34 and the (n+2)-th-column selectionelement layer 34 are aligned in the x-axis direction. However, then-th-column selection element layer 34 and the (n−1)-th-column selectionelement layer 34, and the n-th-column selection element layer 34 and the(n+1)-th-column selection element layer 34 are not aligned in the x-axisdirection.

In the example of FIG. 18, a center of the selection element layer 34 isdisposed so as to match a center of the memory element layer 20 in thexy-plane. That is, the center of the n-th-column selection element layer34 is located in a position offset from the centers of the(n−1)-th-column and (n+1)-th-column selection element layers 34, alongthe y-axis direction by the distance d2/2.

The selection element layers are arranged in this manner, and thus, anarbitrary selection element layer 34 is disposed with equal distancesfrom six selection element layers 34 adjacent to the arbitrary selectionelement layer 34 in the xy-plane. Specifically, for example, sixselection element layers 34(m−1, n), 34(m+1, n), 34(m, n−1), 34(m+1,n−1), 34(m, n+1), and 34(m+1, n+1) adjacent to the selection elementlayer 34(m, n) are arranged in the vertices of the regular hexagon ofwhich one side is the distance d2, and the selection element layer 34(m,n) is disposed in the center of the regular hexagon. As another example,six selection element layers 34(m−1, n+1), 34(m+1, n+1), 34(m−1, n),34(m, n), 34(m−1, n+2), and 34(m, n+2) adjacent to the selection elementlayer 34(m, n+1) are arranged in the vertices of the regular hexagon ofwhich one side is the distance d2, and the selection element layer 34(m,n+1) is disposed in the center of the regular hexagon.

Hereinafter, configurations of sections of the memory cell array 11described in FIG. 18 which are taken along the xz-plane and the yz-planewill be described with reference to FIGS. 19A to 20B. FIGS. 19A to 20Bare examples of sectional views of a stacked structure of the memorycell array of the semiconductor storage device according to the fourthembodiment, which are taken along the xz-plane and the yz-plane.Specifically, FIGS. 19A to 20B show sections taken along a lineXIXA-XIXA, a line XIXB-XIXB, a line XXA-XXA, and a line XXB-XXB shown inFIG. 18. In the following description, differences between FIGS. 19A to20B and FIGS. 9A to 10B will be described.

Initially, the configuration of the section of the memory cell array 11taken along the xz-plane will be described with reference to FIGS. 19Aand 19B.

As shown in FIGS. 19A and 19B, the first regions R1 are formed so as tobe in contact with the wiring layers 32 functioning as the word linesWL(n−1) and WL(n+1) and reach the wiring layers 31 in the section takenalong the line XIXA-XIXA. The first regions R1 are formed so as to be incontact with the wiring layers 32 functioning as the word lines WLn andWL(n+2) and reach the wiring layers 31 in the section taken along theline XIXB-XIXB. The first region R1 in the section taken along the lineXIXA-XIXA and the first region R1 in the section taken along the lineXIXB-XIXB are formed along the x-axis direction so as to be separatedfrom each other by the distance d1.

Hereinafter, the configuration of the section of the memory cell array11 taken along the yz-plane will be described with reference to FIGS.20A and 20B.

As shown in FIGS. 20A and 20B, the first region R1 is formed so as toreach a part of an upper end of the wiring layer 31. Specifically, thefirst region R1 reaches a part of the wiring layer 31 on the +y-axis inthe section taken along the line XXA-XXA, and reaches a part of thewiring layer 31 on the −y-axis in the section taken along the lineXXB-XXB. A center of a width of the first region R1 along the y-axisdirection matches a center of a width of the second region R2 formedimmediately above the first region R1 along the y-axis direction.

That is, the combination of the first region R1 and the second region R2is formed so as to be offset from the wiring layer 31 in the +y-axisdirection in the section taken along the line XXA-XXA, and is formed soas to be offset from the wiring layer 31 in the −y-axis direction in thesection taken along the line XXB-XXB. The combination of the firstregion R1 and the second region R2 in the section taken along the lineXXA-XXA and the combination of the first region R1 and the second regionR2 in the section taken along the line XXB-XXB are formed along they-axis direction so as to be offset from each other by the distanced2/2.

4.2 Advantage According to Present Embodiment

According to the fourth embodiment, the select transistors ST aredisposed in the vertices and the center of the regular hexagon in thexy-plane. Specifically, the select transistors ST which correspond tothe same word line WL and are adjacent to each other are separated fromeach other along the y-axis direction by the distance d2. The selecttransistors ST which correspond to the combination of the same bit lineBL and the same source line SL and are adjacent to each other areseparated from each other along the x-axis direction by the distance d1.The select transistors ST which correspond to the combination of the bitline BL and the source line SL in the m-th row and correspond to then-th-column word line WL and the select transistors ST which correspondto the combination of the bit line BL and the source line SL in the m-throw and correspond to the (n+1)-th-column word line WL are separatedfrom each other along the y-axis direction by the distance d2/2.Accordingly, it is possible to set the distances between all the selecttransistors ST to be equal. Thus, it is possible to reduce amanufacturing fluctuation in a manufacturing stage.

A center of the select transistor ST matches a center of the magnetictunnel junction element MTJ in the xy-plane. Accordingly, it is possibleto increase a contact area between the select transistor ST and themagnetic tunnel junction element MTJ. It is possible to further reducean area occupied by the memory cell in the xy-plane.

In addition, according to the fourth embodiment, it is possible tosimilarly acquire other advantages mentioned in the second embodiment.

4.3 Modification Example of Fourth Embodiment

Although the semiconductor storage device according to the fourthembodiment in which the magnetic tunnel junction element MTJ is formedabove the select transistor ST is described, the present embodiment isnot limited thereto. For example, the magnetic tunnel junction elementMTJ may be formed under the select transistor ST.

FIGS. 21A to 22B are examples of sectional views of a stacked structureof a memory cell array of a semiconductor storage device according to amodification example of the fourth embodiment, which are taken along thexz-plane and the yz-plane. Specifically, FIGS. 21A to 22B show sectionstaken along the line XIXA-XIXA, the line XIXB-XIXB, the line XXA-XXA,and the line XXB-XXB shown in FIG. 18, and correspond to FIGS. 19A to20B.

As shown in FIGS. 21A to 22B, the magnetic tunnel junction element MTJis formed on the wiring layer 31, the select transistor ST is formed onthe magnetic tunnel junction element MTJ, and the wiring layer 33 isformed on the select transistor ST.

The magnetic tunnel junction element MTJ and the select transistor STshown in FIGS. 21A to 22B are merely substituted for the magnetic tunneljunction element MTJ and the select transistor ST shown in FIGS. 19A to20B in the z-axis direction, and the positional relation therebetween inthe xy-plane is not changed.

With such a configuration, even when the select transistor ST is formedon the magnetic tunnel junction element MTJ, it is possible to acquirethe same advantage as that of the fourth embodiment.

5. Fifth Embodiment

Hereinafter, a semiconductor storage device according to a fifthembodiment will be described. In the third embodiment, the selecttransistors are offset from the word lines in the same direction as themagnetic tunnel junction elements, and thus, the select transistors arearranged in the honeycomb shape. In contrast, the fifth embodiment isdifferent from the third embodiment in that the select transistors areoffset from the word line in a direction opposite to a direction themagnetic tunnel junction elements are offset, and thus, the selecttransistors are arranged in the honeycomb shape. That is, in the fifthembodiment, when the center of the magnetic tunnel junction element isoffset from the word line in the +x-axis direction, the center of theselect transistor is offset from the word line in the −x-axis direction.When the center of the magnetic tunnel junction element is offset fromthe word line in the −x-axis direction, the center of the selecttransistor is offset from the word line in the +x-axis direction.Hereinafter, differences from the third embodiment will be described.

5.1 Stacked Structure of Memory Cell Array

A stacked structure of a memory cell array of the semiconductor storagedevice according to the fifth embodiment will be described below.

Initially, a layout of the memory cell array 11 in the xy-plane will bedescribed with reference to FIG. 23. FIG. 23 is a top view of the memorycell array 11 of the semiconductor storage device according to the fifthembodiment when viewed in the +z-axis direction.

As shown in FIG. 23, the arrangement of the wiring layers 31 to 33 andthe memory element layers 20 is the same as that of the thirdembodiment, and thus, the description is omitted.

The selection element layers 34 are arranged in the honeycomb shape inthe xy-plane. Specifically, the center of the selection element layer 34is disposed so as to be offset from the wiring layer 32 in a directionopposite to the direction in which the center of the memory elementlayer 20 is offset from the wiring layer in the xy-plane.

The selection element layers 34 are formed such that at least somethereof overlap in regions occupied by the wiring layers 32. Morespecifically, the center of the m-th-row selection element layer 34 islocated in a position which is offset from the center of the width ofthe corresponding wiring layer 32 along the x-axis direction, in the−x-axis direction. The centers of the (m−1)-th-row and (m+1)-th-rowselection element layers 34 are located in positions, which are offsetfrom the center of the width of the corresponding wiring layer 32 alongthe x-axis direction, in the +x-axis direction. The center of them-th-row selection element layer 34 is located in a position, which isoffset from the centers of the (m−1)-th-row and (m+1)-th-row selectionelement layers 34, along the x-axis direction by the distance d2/2.

The selection element layers are arranged in this manner, and thus, anarbitrary selection element layer 34 is disposed with equal distancesfrom six selection element layers 34 adjacent to the arbitrary selectionelement layer 34 in the xy-plane. Specifically, for example, sixselection element layers 34(m, n−1), 34(m, n+1), 34(m−1, n−1), 34(m−1,n), 34(m+1, n−1), and 34(m+1, n) adjacent to the selection element layer34(m, n) are arranged in the vertices of the regular hexagon of whichone side is the distance d2, and the selection element layer 34(m, n) isdisposed in the center of the regular hexagon. As another example, sixselection element layers 34(m+1, n−1), 34(m+1, n+1), 34(m, n), 34(m,n+1), 34(i m+2, n), and 34(m+2, n+1) adjacent to the selection elementlayer 34(m+1, n) are arranged in the vertices of the regular hexagon ofwhich one side is the distance d2, and the selection element layer34(m+1, n) is disposed in the center of the regular hexagon.

In the example of FIG. 23, the memory element layer 20 and the selectionelement layer 34 do not overlap and are separate from each other in thexy-plane. Thus, an internal connection layer 36 is further formedbetween the memory element layer 20 and the selection element layer 34such that the memory element layer 20 and the selection element layer 34are connected to each other. For example, the internal connection layer36 has an oval shape so as to overlap both the memory element layer 20and the selection element layer 34 in the xy-plane.

Hereinafter, configurations of sections of the memory cell array 11described in FIG. 23 which are taken along the xz-plane and the yz-planewill be described with reference to FIGS. 24A to 25B. FIGS. 24A to 25Bare examples of sectional views of a stacked structure of the memorycell array of the semiconductor storage device according to the fifthembodiment, which are taken along the xz-plane and the yz-plane.Specifically, FIGS. 24A to 25B show sections taken along a lineXXIVA-XXIVA, a line XXIVB-XXIVB, a line XXVA-XXVA, and a line XXVB-XXVBshown in FIG. 23. In the following description, differences betweenFIGS. 24A to 25B and FIGS. 14A to 15B will be described.

Initially, the configuration of the section of the memory cell array 11taken along the xz-plane will be described with reference to FIGS. 24Aand 24B.

As shown in FIGS. 24A and 24B, the first region R1 is formed so as to bein contact with a part of the wiring layer 32. Specifically, the firstregion R1 is in contact with a part of the wiring layer 32 on the+x-axis in the section taken along the line XXIVA-XXIVA, and is incontact with a part of the wiring layer 32 on the −x-axis in the sectiontaken along the XXIVB-XXIVB. A center of a width of the first region R1along the x-axis direction is different from a center of a width of thesecond region R2 formed immediately above the first region R1 along thex-axis direction.

That is, in the section taken along the line XXIVA-XXIVA, the secondregion R2 is formed so as to be offset from the wiring layer 32 in the−x-axis direction, and the first region R1 is formed so as to be offsetfrom the wiring layer 32 in the +x-axis direction. In the section takenalong the line XXIVB-XXIVB, the second region R2 is formed so as to beoffset from the wiring layer 32 in the +x-axis direction, and the firstregion R1 is formed so as to be offset from the wiring layer 32 in the−x-axis direction. The first region R1 and the second region R2 in thesection taken along the line XXIVA-XXIVA and the first region R1 and thesecond region R2 in the section taken along the line XXIVB-XXIVB areformed so as to be offset from each other along the x-axis direction bythe distance d2/2.

The internal connection layer 36 is formed on an upper end of thediffusion layer 43. The internal connection layer 36 further extendstoward the −x-axis direction than the first region R1 in the sectiontaken along the line XXIVA-XXIVA, and further extends toward the +x-axisdirection than the first region R1 in the section taken along the lineXXIVB-XXIVB. The second region R2 is formed on an upper end of theinternal connection layer 36.

Hereinafter, the configuration of the section of the memory cell array11 taken along the yz-plane will be described with reference to FIGS.25A and 25B.

As shown in FIGS. 25A and 25B, the first regions R1 are formed along they-axis direction so as to be separated from one another by the distance2 d 1. Specifically, the first regions R1 are formed on the wiringlayers 31 functioning as the source lines SL(m+1) and SL(m−1) in thesection taken along the line XXVA-XXVA. The first regions R1 are formedabove the wiring layers 31 functioning as the source lines SL(m+2) andSLm in the section taken along the line XXVB-XXVB. The first region R1in the section taken along the line XXVA-XXVA and the first region R1 inthe section taken along the line XXVB-XXVB are formed along the y-axisdirection so as to be separated from each other by the distance d1.

The internal connection layer 36 is located in an upper end of thediffusion layer 43 and a lower end of the conductive layer 44. Forexample, a center of the internal connection layer 36 along the y-axisdirection matches centers of widths of the first region R1 and thesecond region R2 along the y-axis direction.

5.2 Advantage According to Present Embodiment

According to the fifth embodiment, when the magnetic tunnel junctionelement MTJ is offset from the center of the width of the correspondingword line WL along the x-axis direction in the +x-axis direction, theselect transistor ST is offset from the center of the width of thecorresponding word line WL along the x-axis direction in the −x-axisdirection. When the magnetic tunnel junction element MTJ is offset fromthe center of the width of the corresponding word line WL along thex-axis direction in the −x-axis direction, the select transistor ST isoffset from the center of the width of the corresponding word line WLalong the x-axis direction in the +x-axis direction. The selecttransistors ST are disposed in the vertices and the center of theregular hexagon in the xy-plane. Accordingly, the select transistor STdoes not overlap the magnetic tunnel junction element MTJ in thexy-plane. Thus, it is possible to form the magnetic tunnel junctionelement MTJ on a base portion in which the select transistor ST is notpresent. Accordingly, it is possible to reduce a characteristicfluctuation of the magnetic tunnel junction element MTJ in manufacturingthe magnetic tunnel junction element.

The internal connection layer 36 is formed between the select transistorST and the magnetic tunnel junction element MTJ. The internal connectionlayer 36 overlaps both the select transistor ST and the magnetic tunneljunction element MTJ in the xy-plane. Accordingly, it is possible toconnect the select transistor ST and the magnetic tunnel junctionelement MTJ.

In addition, according to the fifth embodiment, it is possible tosimilarly acquire other advantages mentioned in the third embodiment.

5.3 Modification Example of Fifth Embodiment

Although the semiconductor storage device according to the fifthembodiment in which the magnetic tunnel junction element MTJ is formedabove the select transistor ST is described, the present embodiment isnot limited thereto. For example, the magnetic tunnel junction elementMTJ may be formed under the select transistor ST.

FIGS. 26A to 27B are examples of sectional views of a stacked structureof a memory cell array of a semiconductor storage device according to amodification example of the fifth embodiment, which are taken along thexz-plane and the yz-plane. Specifically, FIGS. 26A to 27B show sectionstaken along the line XXIVA-XXIVA, the line XXIVB-XXIVB, the lineXXVA-XXVA, and the line XXVB-XXVB shown in FIG. 23, and correspond toFIGS. 24A to 25B.

As shown in FIGS. 26A to 27B, the magnetic tunnel junction element MTJis formed on the wiring layer 31, the select transistor ST is formed onthe magnetic tunnel junction element MTJ, and the wiring layer 33 isformed on the select transistor ST.

The magnetic tunnel junction element MTJ and the select transistor STshown in FIGS. 26A to 27B are merely substituted for the magnetic tunneljunction element MTJ and the select transistor ST shown in FIGS. 24A to25B in the z-axis direction, and the positional relation therebetween inthe xy-plane is not changed.

With such a configuration, even when the select transistor ST is formedon the magnetic tunnel junction element MTJ, it is possible to acquirethe same advantage as that of the fifth embodiment.

6. Sixth Embodiment

Hereinafter, a semiconductor storage device according to a sixthembodiment will be described. In the fourth embodiment, the selecttransistors are offset from the bit line and the source line in the samedirection with the magnetic tunnel junction elements, and thus, theselect transistors are arranged in the honeycomb shape. In contrast, thesixth embodiment is different from the fourth embodiment in that theselect transistors are offset from the bit line and the source line in adirection opposite to a direction the magnetic tunnel junction elementsare offset, and thus, the select transistors are arranged in thehoneycomb shape. That is, in the sixth embodiment, when the center ofthe magnetic tunnel junction element is offset from the bit line and thesource line in the +y-axis direction, the center of the selecttransistor is offset from the bit line and the source line in the−y-axis direction. When the center of the magnetic tunnel junctionelement is offset from the bit line and the source line in the −y-axisdirection, the center of the select transistor is offset from the bitline and the source line in the +y-axis direction. Hereinafter,differences from the fourth embodiment will be described.

6.1 Stacked Structure of Memory Cell Array

A stacked structure of a memory cell array of the semiconductor storagedevice according to the sixth embodiment will be described below.

Initially, a layout of the memory cell array 11 in the xy-plane will bedescribed with reference to FIG. 28. FIG. 28 is a top view of the memorycell array 11 of the semiconductor storage device according to the sixthembodiment when viewed in the +z-axis direction.

As shown in FIG. 28, the arrangement of the wiring layers 31 to 33 andthe memory element layers 20 is the same as that of the fourthembodiment, and thus, the description is omitted.

The selection element layers 34 are arranged in the honeycomb shape inthe xy-plane. Specifically, the center of the selection element layer 34is disposed so as to be offset from the wiring layers 31 and 33 in adirection opposite to the direction in which the center of the memoryelement layer 20 is offset from the wiring layers in the xy-plane.

In FIG. 28, the selection element layers 34 are formed such that atleast some thereof overlap in regions occupied by the wiring layers 31and 33. More specifically, the center of the n-th-column selectionelement layer 34 is located in a position, which is offset from thecenters of the widths of the corresponding wiring layers 31 and 33 alongthe y-axis direction, in the +y-axis direction. The centers of the(n−1)-th-column and (n+1)-th-column selection element layers 34 arelocated in positions, which are offset from the centers of the widths ofthe corresponding wiring layers 31 and 33 along the y-axis direction, inthe −y-axis direction. The center of the n-th-column selection elementlayer 34 is located in a position offset from the centers of the(n−1)-th-column and (n+1)-th-column selection element layers 34, alongthe y-axis direction by the distance d2/2.

The selection element layers are arranged in this manner, and thus, anarbitrary selection element layer 34 is disposed with equal distancesfrom six selection element layers 34 adjacent to the arbitrary selectionelement layer 34 in the xy-plane. Specifically, for example, sixselection element layers 34(m−1, n), 34(m+1, n), 34(m−1, n−1), 34(m,n−1), 34(m−1, n+1), and 34(m, n+1) adjacent to the selection elementlayer 34(m, n) are arranged in the vertices of the regular hexagon ofwhich one side is the distance d2, and the selection element layer 34(m,n) is disposed in the center of the regular hexagon. As another example,six selection element layers 34(m−1, n+1), 34(m+1, n+1), 34(m, n),34(m+1, n), 34(m, n+2), and 34(m+1, n+2) adjacent to the selectionelement layer 34(m, n+1) are arranged in the vertices of the regularhexagon of which one side is the distance d2, and the selection elementlayer 34(m, n+1) is disposed in the center of the regular hexagon.

In the example of FIG. 28, the memory element layer 20 and the selectionelement layer 34 do not overlap and are separate from each other in thexy-plane. Thus, an internal connection layer 36 is further formedbetween the memory element layer 20 and the selection element layer 34such that the memory element layer 20 and the selection element layer 34are connected to each other. For example, the internal connection layer36 has an oval shape so as to overlap both the memory element layer 20and the selection element layer 34 in the xy-plane.

Hereinafter, configurations of sections of the memory cell array 11described in FIG. 28 which are taken along the xz-plane and the yz-planewill be described with reference to FIGS. 29A to 30B. FIGS. 29A to 30Bare examples of sectional views of a stacked structure of the memorycell array of the semiconductor storage device according to the sixthembodiment, which are taken along the xz-plane and the yz-plane.Specifically, FIGS. 29A to 30B show sections taken along a lineXXIXA-XXIXA, a line XXIXB-XXIXB, a line XXXA-XXXA, and a line XXXB-XXXBshown in FIG. 28. In the following description, differences betweenFIGS. 29A to 30B and FIGS. 19A to 20B will be described.

Initially, the configuration of the section of the memory cell array 11taken along the xz-plane will be described with reference to FIGS. 29Aand 29B.

As shown in FIGS. 29A and 29B, the first regions R1 are formed so as tobe separated from one another along the x-axis direction by the distance2 d 1. Specifically, the first regions R1 are formed so as to be incontact with the wiring layers 32 functioning as the word lines WLn andWL(n+2) and reach the wiring layers 31 in the section taken along theline XXIXA-XXIXA. The first regions R1 are formed so as to be incontract with the wiring layers 32 functioning as the word lines WL(n−1)and WL(n+1) and reach the wiring layers 31 in the section taken alongthe line XXIXB-XXIXB. The first region R1 in the section taken along theline XXIXA-XXIXA and the first region R1 in the section taken along theline XXIXB-XXIXB are formed along the x-axis direction so as to beseparated from each other by the distance d1.

The internal connection layer 36 is located in an upper end of thediffusion layer 43 and on the lower end of the conductive layer 44. Thecenter of the internal connection layer 36 along the x-axis directionmatches the centers of the widths of the first region R1 and the secondregion R2 along the x-axis direction.

Hereinafter, the configuration of the section of the memory cell array11 taken along the yz-plane will be described with reference to FIGS.30A and 30B.

As shown in FIGS. 30A and 30B, the first region R1 is formed so as toreach a part of an upper end of the wiring layer 31. Specifically, thefirst region R1 is formed so as to be offset from the center of thewidth of the wiring layer 31 along the y-axis direction in the −y-axisdirection in the section taken along the line XXXA-XXXA, and is formedso as to be offset from the center of the width of the wiring layer 31along the y-axis direction in the +y-axis direction in the section takenalong the line XXXB-XXXB. A center of a width of the first region R1along the x-axis direction is different from a center of a width of thesecond region R2 formed immediately above the first region R1 along thex-axis direction.

That is, the first region R1 in the section taken along the lineXXXA-XXXA and the first region R1 in the section taken along the lineXXXB-XXXB are formed along the y-axis direction so as to be separatedfrom each other by the distance d2/2.

The internal connection layer 36 is formed on an upper end of thediffusion layer 43. The internal connection layer 36 further extendstoward the +y-axis direction than the first region R1 in the sectiontaken along the line XXXA-XXXA, and further extends toward the −y-axisdirection than the first region R1 in the section taken along the lineXXXB-XXXB. The second region R2 is formed on an upper end of theinternal connection layer 36.

6.2 Advantage According to Present Embodiment

According to the sixth embodiment, when the magnetic tunnel junctionelement MTJ is offset from the centers of the widths of thecorresponding bit line BL and source line SL along the y-axis directionin the +y-axis direction, the select transistor ST is offset from thecenters of the widths of the corresponding bit line BL and source lineSL along the y-axis direction in the −y-axis direction. When themagnetic tunnel junction element MTJ is offset from the centers of thewidths of the corresponding bit line BL and source line SL along they-axis direction in the −y-axis direction, the select transistor ST isoffset from the centers of the widths of the corresponding bit line BLand source line SL along the y-axis direction in the +y-axis direction.The select transistors ST are disposed in the vertices and the center ofthe regular hexagon in the xy-plane. Accordingly, the select transistorST does not overlap the magnetic tunnel junction element MTJ in thexy-plane. Thus, it is possible to form the magnetic tunnel junctionelement MTJ on a base portion in which the select transistor ST is notpresent. Accordingly, it is possible to reduce a characteristicfluctuation of the magnetic tunnel junction element MTJ in manufacturingthe magnetic tunnel junction element.

The internal connection layer 36 is formed between the select transistorST and the magnetic tunnel junction element MTJ. The internal connectionlayer 36 overlaps both the select transistor ST and the magnetic tunneljunction element MTJ in the xy-plane. Accordingly, it is possible toconnect the select transistor ST and the magnetic tunnel junctionelement MTJ.

In addition, according to the sixth embodiment, it is possible tosimilarly acquire other advantages mentioned in the fourth embodiment.

6.3 Modification Example of Sixth Embodiment

Although the semiconductor storage device according to the sixthembodiment in which the magnetic tunnel junction element MTJ is formedabove the select transistor ST is described, the present embodiment isnot limited thereto. For example, the magnetic tunnel junction elementMTJ may be formed under the select transistor ST.

FIGS. 31A to 32B are examples of sectional views of a stacked structureof a memory cell array of a semiconductor storage device according to amodification example of the sixth embodiment, which are taken along thexz-plane and the yz-plane. Specifically, FIGS. 31A to 32B show sectionstaken along the line XXIXA-XXIXA, the line XXIXB-XXIXB, the lineXXXA-XXXA, and the line XXXB-XXXB shown in FIG. 28, and correspond toFIGS. 29A to 30B.

As shown in FIGS. 31A to 32B, the magnetic tunnel junction element MTJis formed on the wiring layer 31, and the internal connection layer 36is formed on the magnetic tunnel junction element MTJ. The selecttransistor ST is formed on the internal connection layer 36, and thewiring layer 33 is formed on the select transistor ST.

The magnetic tunnel junction element MTJ and the select transistor STshown in FIGS. 31A to 32B are merely substituted for the magnetic tunneljunction element MTJ and the select transistor ST shown in FIGS. 29A to30B in the z-axis direction, and the positional relation therebetween inthe xy-plane is not changed.

With such a configuration, even when the select transistor ST is formedon the magnetic tunnel junction element MTJ, it is possible to acquirethe same advantage as that of the sixth embodiment.

7. Seventh Embodiment

Hereinafter, a semiconductor storage device according to a seventhembodiment will be described. Although the example in which thetransistor is used as the element for selecting the memory element isdescribed in the first embodiment to the sixth embodiment, a case wherea non-linear element having a rectifying action such as a diode is usedwill be described in the seventh embodiment.

That is, the semiconductor device according to the seventh embodimentmay be applied to not the semiconductor storage device including thevariable resistance element having a necessity for a current to flow inboth directions but the semiconductor storage device including variableresistance element without having a necessity for a large current toflow in both direction. For example, a resistive random-access memory(ReRAM) or a phase-change random-access memory (PCRAM) are known as thesemiconductor storage device including the above-described variableresistance element.

Hereinafter, differences from the first embodiment will be described.

7.1 Configuration

Initially, a configuration of the semiconductor storage device accordingto the seventh embodiment will be described.

7.1.1. Configuration of Semiconductor Storage Device

FIG. 33 is a block diagram showing a configuration of a semiconductorstorage device 1A according to the seventh embodiment. FIG. 33corresponds to FIG. 1. As shown in FIG. 33, the semiconductor storagedevice 1A includes a memory cell array 11A. The semiconductor storagedevice 1A includes a word line and bit line selection circuit 17 insteadof the row decoder.

The memory cell array 11A includes a plurality of memory cells MCassociated with rows and columns. The memory cells MC present in thesame row are connected to the same word line WL, and both ends of thememory cells MC present in the same column are connected to the same bitline BL.

The memory cell MC includes a selector SEL and a variable resistanceelement VR. For example, the selector SEL includes a first end connectedto the word line WL and a second end connected to a first end of thevariable resistance element VR. For example, the selector SEL has arectifying function, and is formed as a bi-directional switching elementthat controls the supply of a current to the variable resistance elementVR. For example, the variable resistance element VR includes a secondend connected to the bit line BL. In the following description, a casewhere the selector SEL and the variable resistance element VR areconnected between the bit line BL and the word line WL in the ordershown in FIG. 33 will be described, but the present embodiment is notlimited thereto. For example, the first end of the selector SEL may beconnected to the bit line BL, and the second end of the variableresistance element VR may be connected to the word line WL.

For example, the word line and bit line selection circuit 17 isconnected between the WC/RC 12 and the memory cell array 11A, and isconnected to the bit line BL and the word line WL. Since the word lineand bit line selection circuit 17 supplies a current to the memory cellMC which is an operation target through the bit line BL and the wordline WL, the word line and bit line selection circuit selects the bitline BL and the word line WL connected to the memory cell MC which isthe operation target.

7.1.2. Stacked Structure of Memory Cell Array

Hereinafter, a stacked structure of a memory cell array of thesemiconductor storage device according to the seventh embodiment will bedescribed.

Initially, a layout of the memory cell array 11A in the xy-plane will bedescribed with reference to FIG. 34. FIG. 34 is a top view of the memorycell array 11A of the semiconductor storage device according to theseventh embodiment when viewed in the +z-axis direction.

As shown in FIG. 34, a plurality of wiring layers 61 each functioning asthe word line WL extend, for example, along the y-axis direction, andare arranged along the x-axis direction at equal intervals. In theexample of FIG. 34, four wiring layers 61 corresponding to an(n−1)-th-column word line WL(n−1), an n-th-column word line WLn, an(n+1)-th-column word line WL(n+1), and an (n+2)-th-column word lineWL(n+2) are illustrated. Two wiring layers 61 adjacent to each other areseparated from each other along the x-axis direction by a distance d2.

A plurality of wiring layers 62 each functioning as the bit line BL isformed above the wiring layers 61. For example, the wiring layers 62extend along the x-axis direction, and are arranged along the y-axisdirection at equal intervals. In the example of FIG. 34, four wiringlayers 62 corresponding to a (m−1)-th-row bit line BL(m−1), an m-th-rowbit line BLm, an (m+1)-th-row bit line BL(m+1), and an (m+2)-th-row bitline BL(m+2) are illustrated. Specifically, two wiring layers 62adjacent to each other are separated from each other along the y-axisdirection by the distance d1.

In FIG. 34, a selection element layer 63 functioning as the selector SELis formed in a region in which the wiring layer 61 and the wiring layer62 intersect with each other. For example, the selection element layer63 has a cylindrical shape that extends along the z-axis direction, andis formed between the wiring layer 61 and the wiring layer 62. In theexample of FIG. 34, the center of the selection element layer 63 islocated at an intersection of a central line of the wiring layer 61along the y-axis direction and a central line of the wiring layer 62along the x-axis direction. That is, the selection element layers 63 arearranged in a rectangular grid in the xy-plane. Specifically, theselection element layers 63 are arranged along the x-axis direction atequal intervals for every distance d2, and are arranged along the y-axisdirection at equal intervals for every distance d1. The selectionelement layers are arranged in this manner, and thus, the selectionelement layers 63 are formed one by one for the combination of thewiring layer 62 in a certain row and the wiring layer 61 in a certaincolumn.

In FIG. 34, the memory element layers 64 functioning as the variableresistance elements VR are formed such that at least some thereofoverlap in regions occupied by the selection element layers 63. Forexample, the memory element layer 64 has a cylindrical shape thatextends along the z-axis direction, and is formed between the wiringlayer 61 and the wiring layer 62.

The memory element layers 64 are arranged in the honeycomb shape in thexy-plane. Specifically, the memory element layers 64 are arranged in aposition of vertices and a center of a regular hexagon of which a lengthof one side is the distance d2 in the xy-plane. More specifically, thememory element layers 64 are arranged along the x-axis direction atequal intervals for every distance d2, and are arranged along the y-axisdirection at equal intervals for every distance 2 d 1. That is, an(m−1)-th-row memory element layer 64 and an (m+1)-th-row memory elementlayer 64 are aligned in the y-axis direction. An m-th-row memory elementlayer 64 and an (m+2)-th-row memory element layer 64 are aligned in they-axis direction. However, the m-th-row memory element layer 64 and the(m−1)-th-row memory element layer 64, and the m-th-row memory elementlayer 64 and the (m+1)-th-row memory element layer 64 are not aligned inthe y-axis direction.

In the example of FIG. 34, the center of the m-th-row memory elementlayer 64 is located in a position, which is offset from the center ofthe width of the corresponding wiring layer 61 along the x-axisdirection, in the +x-axis direction. The centers of the (m−1)-th-row and(m+1)-th-row memory element layers 64 are located in positions, whichare offset from the center of the width of the corresponding wiringlayer 61 along the x-axis direction, in the −x-axis direction. Thecenter of the m-th-row memory element layer 64 is located in a positionoffset from the centers of the (m−1)-th-row and (m+1)-th-row memoryelement layers 64 along the x-axis direction by a distance d2/2.

The memory element layers are arranged in this manner, and thus, thememory element layers 64 are formed so as to correspond to the selectionelement layers 63, and are formed one by one for the combination of thewiring layer 62 in a certain row and the wiring layer 61 in a certaincolumn. An arbitrary memory element layer 64 is disposed with equaldistances from six memory element layers 64 adjacent to the arbitrarymemory element layer 64 in the xy-plane. Specifically, for example, sixmemory element layers 64(m, n−1), 64(m, n+1), 64(m−1, n), 64(m−1, n+1),64(m+1, n), and 64(m+1, n+1) adjacent to the memory element layer 64(m,n) are arranged in the vertices of the regular hexagon of which one sideis the distance d2, and the memory element layer 64(m, n) is disposed inthe center of the regular hexagon. As another example, six memoryelement layer 64(m+1, n−1), 64(m+1, n+1), 64(m, n−1), 64(m, n), 64(m+2,n−1), and 64(m+2, n) adjacent to the memory element layer 64(m+1, n) arearranged in the vertices of the regular hexagon of which one side is thedistance d2, and the memory element layer 64(m+1, n) is disposed in thecenter of the regular hexagon.

Hereinafter, configurations of sections of the memory cell array 11Adescribed in FIG. 34 which are taken along the xz-plane and the yz-planewill be described with reference to FIGS. 35A to 36B. FIGS. 35A to 36Bare examples of sectional views of a stacked structure of the memorycell array of the semiconductor storage device according to the seventhembodiment, which are taken along the xz-plane and the yz-plane.Specifically, FIGS. 35A to 36B show sections taken along a lineXXXVA-XXXVA, a line XXXVB-XXXVB, a line XXXVIA-XXXVIA, and a lineXXXVIB-XXXVIB shown in FIG. 34. In FIGS. 35A to 36B, some insulatinglayers are omitted for simplicity of illustration.

Initially, the configuration of the section of the memory cell array 11Ataken along the xz-plane will be described with reference to FIGS. 35Aand 35B.

As shown in FIGS. 35A and 35B, the plurality of wiring layers 61functioning as the word lines WL(n−1), WLn, WL(n+1), and WL(n+2) isformed on the semiconductor substrate 30 at equal intervals for everydistance d2 in the section taken along the line XXXVA-XXXVA. Aninsulating film (not shown) is formed on top surfaces of the wiringlayers 61.

First regions R1 are respectively formed in a plurality of regions inwhich the selectors SEL are formed. The first regions R1 are formedalong the x-axis direction so as to be separated from one another by thedistance d2. For example, the selection element layer 63 functioning asthe selector SEL is formed within the first region Rl. An insulatingfilm (not shown) is formed in a layer on an upper end of the selectionelement layer 63.

Second regions R2 are respectively formed in a plurality of regions inwhich the variable resistance elements VR are formed. The second regionsR2 are formed along the x-axis direction so as to be separated from oneanother by the distance d2. Each second region R2 reaches a part of theupper end of the selection element layer 63. A conductive layer 65, thememory element layer 64, and a conductive layer 65 are sequentiallystacked within the second region R2. The memory element layer 64functions as the variable resistance element VR. The conductive layers65 and 66 function as a lower electrode and an upper electrode of thevariable resistance element VR, respectively. Accordingly, a one-sideend of the variable resistance element VR and the other-side end of theselector SEL are connected to each other.

In a layer on an upper end of the conductive layer 66, the wiring layer62 functioning as the bit line BL(m−1) is formed in the section takenalong the line XXXVA-XXXVA, and the wiring layer 62 functioning as thebit line BLm is formed in the section taken along the line XXXVB-XXXVB.The wiring layer 62 is commonly connected to the other-side ends of thevariable resistance elements VR of the plurality of memory cells MCarranged along the x-axis direction.

The second region R2 is formed so as to be offset from the first regionR1 in the x-axis direction while maintaining a state in which theconductive layer 65 is electrically connected to the selection elementlayer 63. Specifically, the second region R2 is formed so as to beoffset from the first region R1 in the −x-axis direction in the sectiontaken along the line XXXVA-XXXVA, and is formed as to be offset from thefirst region R1 in the +x-axis direction in the section taken along theline XXXVB-XXXVB. The second region R2 in the section taken along theline XXXVA-XXXVA and the second region R2 in the section taken along theline XXXVB-XXXVB are formed along the x-axis direction so as to beoffset from each other along the x-axis direction by the distance d2/2.

Hereinafter, the configuration of the section of the memory cell array11A taken along the yz-plane will be described with reference to FIGS.36A and 36B.

As shown in FIGS. 36A and 36B, the wiring layer 61 functioning as theword line WL(n−1) is formed on the semiconductor substrate 30. Theplurality of wiring layers 62 functioning as the bit lines BL(m+2),BL(m+1), BLm, and BL(m−1) is formed above the wiring layers 61 at equalintervals for every distance d1.

The first regions R1 are formed along the y-axis direction so as to beseparated from one another by the distance d1. The selector SEL havingthe same configuration as that of the selector SEL described in FIGS.35A and 35B is formed in the first region R1. The plurality of selectorsSEL formed along the y-axis direction is commonly connected to the samewiring layer 61.

The second regions R2 are formed along the y-axis direction so as to beseparated from one another by the distance 2 d 1. Specifically, thesecond regions R2 are formed under the wiring layers 62 functioning asthe bit lines BL(m+2) and BLm in the section taken along the lineXXXVIA-XXXVIA. The second regions R2 are formed under the wiring layers62 functioning as the bit lines BL(m+1) and BL(m−1) in the section takenalong the line XXXVIB-XXXVIB. The second regions R2 in the section takenalong the line XXXVIA-XXXVIA and the second regions R2 in the sectiontaken along the line XXXVIB-XXXVIB are formed along the y-axis directionso as to be separated from each other by the distance d1. The variableresistance element VR having the same configuration as that of thevariable resistance element VR described in FIGS. 35A and 35B is formedin the second region R2.

The wiring layer 62 is formed in the layer on the upper end of theconductive layer 66. The wiring layers 62 functioning as the bit linesBL(m+2) and BLm are connected to the conductive layer 66 in the sectiontaken along the line XXXVIA-XXXVIA, and the wiring layers 62 functioningas the bit lines BL(m+1) and BL(m−1) are connected to the conductivelayers 62 in the section taken along the line XXXVIB-XXXVIB. A center ofa width of the wiring layer 62 along the y-axis direction matchescenters of widths of the second region R2 and the first region R1 formedimmediately under the wiring layer 62 along the y-axis direction.

7.2 Advantage According to Present Embodiment

According to the seventh embodiment, the variable resistance elements VRare disposed in the vertices and the center of the regular hexagon inthe xy-plane. Specifically, the variable resistance elements VR whichcorrespond to the same bit line BL and are adjacent to each other areseparated along the x-axis direction by the distance d2. The variableresistance elements VR which correspond to the same word line WL and areadjacent to each other are separated from each other along the y-axisdirection by the distance d1. The variable resistance element VR whichcorresponds to the m-th-row bit line BL and the n-th-column word line WLand the variable resistance element VR which corresponds to the(m+1)-th-row bit line BL and the n-th-column word line WL are separatedalong the x-axis direction by the distance d2/2. Accordingly, it ispossible to set the distances between all the variable resistanceelements VR adjacent to each other to be equal. Thus, a manufacturingfluctuation in a manufacturing stage can be reduced in the embodimentcompared to the arrangement in which the distances between all thevariable resistance elements adjacent to each other are not equal, suchas in the case of the memory cells arranged in the rectangular grid.

In addition, according to the seventh embodiment, it is possible tosimilarly acquire other advantages mentioned in the first embodiment.

8. Eighth Embodiment

Hereinafter, a semiconductor storage device according to an eighthembodiment will be described. The variable resistance element is offsetfrom the selector along the x-axis direction in the seventh embodiment,whereas the variable resistance element is offset from the selectoralong the y-axis direction. Hereinafter, differences from the seventhembodiment will be described.

8.1 Stacked Structure of Memory Cell Array

A stacked structure of a memory cell array of the semiconductor storagedevice according to the eighth embodiment will be described below.

Initially, a layout of the memory cell array 11A in the xy-plane will bedescribed with reference to FIG. 37. FIG. 37 is a top view of the memorycell array 11 of the semiconductor storage device according to theeighth embodiment when viewed in the +z-axis direction.

As shown in FIG. 37, two wiring layers 62 adjacent to each other areseparated from each other along the y-axis direction by the distance d2.Two wiring layers 61 adjacent to each other are separated from eachother along the x-axis direction by the distance d1.

Selection element layers 63 are arranged in a rectangular grid in thexy-plane. Specifically, the selection element layers 63 are arranged,for example, along the x-axis direction at equal intervals for everydistance d1, and are arranged along the y-axis direction at equalintervals for every distance d2.

The memory element layers 64 are arranged in the honeycomb shape in thexy-plane. Specifically, the memory element layers 64 are arranged in aposition of vertices and a center of a regular hexagon of which a lengthof one side is the distance d2 in the xy-plane. More specifically, thememory element layers 64 are arranged along the y-axis direction atequal intervals for every distance d2, and are arranged along the x-axisdirection at equal intervals for every distance 2 d 1. That is, the(n−1)-th-column memory element layer 64 and the (n+1)-th-column memoryelement layer 64 are arranged in a similar order along the x-axisdirection. An n-th-column memory element layer 64 and an (n+2)-th-columnmemory element layer 64 are arranged in a similar order along the x-axisdirection. However, the n-th-column memory element layer 64, the(n−1)-th-column memory element layer 64, and the (n+1)-th-column memoryelement layer 64 are not arranged in the x-axis direction.

In the example of FIG. 37, a center of the n-th-column memory elementlayer 64 is located in a position, which is offset from a center of awidth of the corresponding wiring layer 62 along the y-axis direction,in the −y-axis direction. Centers of the (n−1)-th-column and(n+1)-th-column memory element layers 64 are located in positions, whichare offset from a center of a width of the corresponding wiring layer 62along the y-axis direction, in the +y-axis direction. The center of then-th-column memory element layer 64 is positioned in a position offsetfrom the centers of the (n−1)-th-column and (n+1)-th-column memoryelement layers 64, along the y-axis direction by the distance d2/2.

The memory element layers are arranged in this manner, and thus, anarbitrary memory element layer 64 is disposed with equal distances fromsix memory element layers 64 adjacent to the arbitrary memory elementlayer 64 in the xy-plane. Specifically, for example, six memory elementlayers 64(m−1, n), 64(m+1, n), 64(m, n−1), 64(m+1, n−1), 64(m, n+1), and64(m+1, n+1) adjacent to the memory element layer 64(m, n) are arrangedin the vertices of the regular hexagon of which one side is the distanced2, and the memory element layer 64(m, n) is disposed in the center ofthe regular hexagon. As another example, six memory element layers64(m−1, n+1), 64(m+1, n+1), 64(m−1, n), 64(m, n), 64(m−1, n+2), and64(m, n+2) adjacent to the memory element layer 64(m, n+1) are arrangedin the vertices of the regular hexagon of which one side is the distanced2, and the memory element layer 64(m, n+1) is disposed in the center ofthe regular hexagon.

Hereinafter, configurations of sections of the memory cell array 11Adescribed in FIG. 37 which are taken along the xz-plane and the yz-planewill be described with reference to FIGS. 38A to 39B. FIGS. 38A to 39Bare examples of sectional views of a stacked structure of the memorycell array of the semiconductor storage device according to the eighthembodiment, which are taken along the xz-plane and the yz-plane.Specifically, FIGS. 38A to 39B show sections taken along a line XXXVI IIA-XXXVI I IA, a line XXXVIIIB-XXXVIIIB, a line XXXIXA-XXXIXA, and aline XXXIXB-XXXIXB shown in FIG. 37. In the following description,differences between FIGS. 38A to 39B and FIGS. 35A to 36B will bedescribed.

Initially, the configuration of the section of the memory cell array 11Ataken along the xz-plane will be described with reference to FIGS. 38Aand 38B.

As shown in FIGS. 38A and 38B, the plurality of wiring layers 32functioning as the word lines WL(n−1), WLn, WL(n+1), and WL(n+2) isformed in the same layer above the semiconductor substrate 30 at equalintervals for every distance d1.

The first regions R1 are formed along the x-axis direction so as to beseparated from one another by the distance d1. A center of a width ofthe first region R1 along the x-axis direction matches a center of awidth of the wiring layer 61 formed immediately under the first regionR1 along the x-axis direction. The selector SEL having the sameconfiguration as that of the selector SEL described in theabove-mentioned embodiment is formed in the first region R1.

Second regions R2 are formed along the x-axis direction so as to beseparated from each other by the distance 2 d 1. Specifically, thesecond regions R2 are formed above the wiring layers 61 functioning asthe word lines WL(n−1) and WL(n+1) in the section taken along the lineXXXVIIIA-XXXVIIIA. The second regions R2 are formed above the wiringlayers 61 functioning as the word lines WLn and WL(n+2) in the sectiontaken along the line XXXVIIIB-XXXVIIIB. The second regions R2 in thesection taken along the line XXXVIIIA-XXXVIIIA and the second regions R2in the section taken along the line XXXVIIIB-XXXVIIIB are formed alongthe x-axis direction so as to be separated from each other by thedistance d1. A center of a width of the second region R2 along thex-axis direction matches a center of a width of the first region R1formed immediately under the second region R2 along the x-axisdirection. The variable resistance element VR having the sameconfiguration as that of the variable resistance element VR described inthe above-described embodiment is formed in the second region R2.

Hereinafter, the configuration of the section of the memory cell array11A taken along the yz-plane will be described with reference to FIGS.39A and 39B.

As shown in FIGS. 39A and 39B, on the semiconductor substrate 30, thewiring layer 61 functioning as the word line WL(n−1) is formed in thesection taken along the line XXXIXA-XXXIXA, and the wiring layer 61functioning as the word line WLn is formed in the section taken alongthe line XXXIXB-XXXIXB.

The first regions R1 are formed along the y-axis direction so as to beseparated from one another by the distance d2.

The second regions R2 are formed along the y-axis direction so as to beseparated from one another by the distance d2. The second region R2 isformed so as to be offset from the first region R1 in the y-axisdirection while maintaining a state in which the conductive layer 65 iselectrically connected to the selection element layer 63. Specifically,the second region R2 is formed so as to be offset from the first regionR1 in the +y-axis direction in the section taken along the lineXXXIXA-XXXIXA, and is formed so as to be offset from the first region R1in the −y-axis direction in the section taken along the lineXXXIXB-XXXIXB. The second region R2 in the section taken along the lineXXXIXA-XXXIXA and the second region R2 in the section taken along theline XXXIXB-XXXIXB are formed along the x-axis direction so as to beoffset from each other along the x-axis direction by the distance d2/2.

The plurality of wiring layers 62 functioning as the bit lines BL(m+2),BL(m+1), BLm, and BL(m−1) is formed on an upper end of the conductivelayer 66 at equal intervals by the distance d2. A center of a width ofthe wiring layer 62 along the y-axis direction matches a center of awidth of the first region R1 formed immediately under the wiring layer62 along the y-axis direction.

8.2 Advantage According to Present Embodiment

According to the eighth embodiment, the variable resistance elements VRare disposed in the vertices and the center of the regular hexagon inthe xy-plane. Specifically, the variable resistance elements VR whichcorrespond to the same word line WL and are adjacent to each other areseparated from each other along the y-axis direction by the distance d2.The variable resistance elements VR which correspond to the same bitline BL and are adjacent to each other are separated from each otheralong the x-axis direction by the distance d1. The variable resistanceelement VR which corresponds to the m-th-row bit line BL and then-th-column word line WL and the variable resistance element VR whichcorresponds to the m-th-row bit line BL and the (n+1)-th-column wordline WL are separated along the y-axis direction by the distance d2/2.Accordingly, it is possible to set the distances between all thevariable resistance elements VR adjacent to each other to be equal.Thus, a manufacturing fluctuation in a manufacturing stage can bereduced in the embodiment compared to the arrangement in which thedistances between all the variable resistance elements adjacent to eachother are not equal, such as in the case of the memory cells arranged inthe rectangular grid.

In addition, according to the eighth embodiment, it is possible tosimilarly acquire other advantages mentioned in the seventh embodiment.

9. Ninth Embodiment

Hereinafter, a semiconductor storage device according to a ninthembodiment will be described. The selectors are arranged in therectangular grid in the seventh embodiment and the eighth embodiment,whereas the selectors are arranged in the honeycomb shape in the ninthembodiment. In the ninth embodiment, the selectors are arrangedsimilarly to the arrangement of the variable resistance elementsdescribed in the seventh embodiment. That is, the center of the selectorin the xy-plane matches the center of the variable resistance element inthe ninth embodiment. Hereinafter, differences from the seventhembodiment will be described.

9.1 Stacked Structure of Memory Cell Array

A stacked structure of a memory cell array of the semiconductor storagedevice according to the ninth embodiment will be described below.

Initially, a layout of the memory cell array 11A in the xy-plane will bedescribed with reference to FIG. 40. FIG. 40 is a top view of the memorycell array 11A of the semiconductor storage device according to theninth embodiment when viewed in the +z-axis direction.

As shown in FIG. 40, the arrangement of the wiring layers 61 and 62 andthe memory element layers 64 is the same as that of the seventhembodiment, and thus, the description is omitted.

The selection element layers 63 are arranged in the honeycomb shape inthe xy-plane. Specifically, the selection element layers 63 are arrangedin vertices and a center of a regular hexagon of which a length of oneside is the distance d2 in the xy-plane. More specifically, theselection element layers 63 are arranged along the x-axis direction atequal intervals for every distance d2, and are arranged along the y-axisdirection at equal intervals for every distance 2 d 1. That is, an(m−1)-th-row selection element layer 63 and an (m+1)-th-row selectionelement layer 63 are arranged in a similar order along the y-axisdirection. An m-th-row selection element layer 63 and an (m+2)-th-rowselection element layer 63 are arranged in a similar order along they-axis direction. However, the m-th-row selection element layer 63, the(m−1)-th-row selection element layer 63, and the (m+1)-th-row selectionelement layer 63 are not arranged along the y-axis direction.

In the example of FIG. 40, a center of the selection element layer 63 isdisposed so as to match a center of the memory element layer 64 in thexy-plane. That is, a center of the m-th-row selection element layer 63is located in a position offset from centers of the (m−1)-th-row and(m+1)-th-row selection element layers 63 along the x-axis direction bythe distance d2/2.

The selection element layers are arranged in this manner, and thus, anarbitrary selection element layer 63 is disposed with equal distancesfrom six selection element layers 63 adjacent to the arbitrary selectionelement layer 63 in the xy-plane. Specifically, for example, sixselection element layers 63(m, n−1), 63(m, n+1), 63(m−1, n), 63(m−1,n+1), 63(m+1, n), and 63(m+1, n+1) adjacent to the selection elementlayer 63(m, n) are arranged in the vertices of the regular hexagon ofwhich one side is the distance d2, and the selection element layer 63(mn) is disposed in the center of the regular hexagon. As another example,six selection element layers 63(m+1, n−1), 63(m+1, n+1), 63(m, n−1),63(m, n), 63(m+2, n−1), and 63(m+2, n) adjacent to the selection elementlayer 63(m+1, n) are arranged in the vertices of the regular hexagon ofwhich one side is the distance d2, and the selection element layer63(m+1, n) is disposed in the center of the regular hexagon.

Hereinafter, configurations of sections of the memory cell array 11Adescribed in FIG. 40 which are taken along the xz-plane and the yz-planewill be described with reference to FIGS. 41A to 42B. FIGS. 41A to 42Bare examples of sectional views of a stacked structure of the memorycell array of the semiconductor storage device according to the ninthembodiment, which are taken along the xz-plane and the yz-plane.Specifically, FIGS. 41A to 42B show sections taken along a lineXXXXIA-XXXXIA, a line XXXXIB-XXXXIB, a line XXXXIIA-XXXXIIA, and a lineXXXXIIB-XXXXIIB shown in FIG. 40. In the following description,differences between FIGS. 41A to 42B and FIGS. 35A to 36B will bedescribed.

Initially, the configuration of the section of the memory cell array 11Ataken along the xz-plane will be described with reference to FIGS. 41Aand 41B.

As shown in FIGS. 41A and 41B, the first region R1 is formed so as toreach a part of an upper end of the wiring layer 62. Specifically, thefirst region R1 is in contact with a part of the wiring layer 61 on the−x-axis in the section taken along the line XXXXIA-XXXXIA, and is incontact with a part of the wiring layer 61 on the +x-axis in the sectiontaken along the line XXXXIB-XXXXIB. A center of a width of the firstregion R1 along the x-axis direction matches a center of a width of thesecond region R2 formed immediately above the first region R1 along thex-axis direction.

That is, the combination of the first region R1 and the second region R2is formed so as to be offset from the wiring layer 61 in the −x-axisdirection in the section taken along the line XXXXIA-XXXXIA, and isformed so as to be offset from the wiring layer 61 in the +x-axisdirection in the section taken along the line XXXXIB-XXXXIB. Thecombination of the first region R1 and the second region R2 in thesection taken along the line XXXXIA-XXXXIA and the combination of thefirst region R1 and the second region R2 in the section taken along theline XXXXIB-XXXXIB are formed along the x-axis direction so as to beoffset from each other by the distance d2/2.

Hereinafter, the configuration of the section of the memory cell array11A taken along the yz-plane will be described with reference to FIGS.42A and 42B.

As shown in FIGS. 42A and 42B, the first region R1 and the second regionR2 are formed such that the centers of the widths along the y-axisdirection match each other. The combination of the first region R1 andthe second region R2 are formed along the y-axis direction so as to beoffset by the distance 2 d 1. Specifically, the combinations of thefirst regions R1 and the second regions R2 are formed under the wiringlayers 62 functioning as the bit lines BL(m+2) and BLm in the sectiontaken along the line XXXXIIA-XXXXIIA. The combinations of the firstregions R1 and the second regions R2 are formed under the wiring layers62 functioning as the bit lines BL(m+1) and BL(m−1) in the section takenalong the line XXXXIIB-XXXXIIB. The combination of the first region R1and the second region R2 formed under the wiring layer 62 functioning asthe bit line BL(m−1) and the combination of the first region R1 and thesecond region R2 formed under the wiring layer 62 functioning as the bitline BLm are formed along the y-axis direction so as to be separatedfrom each other by the distance d1.

9.2 Advantage According to Present Embodiment

According to the ninth embodiment, the selectors SEL are disposed in thevertices and the center of the regular hexagon in the xy-plane.Specifically, the selectors SEL which correspond to the same bit line BLand are adjacent to each other are separated along the x-axis directionby the distance d2. The selectors SEL which correspond to the same wordline WL and are adjacent to each other are separated from each otheralong the y-axis direction by the distance d1. The selector SEL whichcorresponds to the m-th-row bit line BL and the n-th-column word line WLand the selector SEL which corresponds to the (m+1)-th-row bit line BLand the n-th-column word line WL are separated along the x-axisdirection by the distance d2/2. Accordingly, it is possible to set thedistances between all the selectors SEL adjacent to each other to beequal. Thus, it is possible to reduce a manufacturing fluctuation in amanufacturing stage.

A center of the selector SEL matches a center of the variable resistanceelement VR in the xy-plane. Accordingly, it is possible to increase acontact area between the selector SEL and the variable resistanceelement VR. It is possible to further reduce an area occupied by thememory cell in the xy-plane.

In addition, according to the ninth embodiment, it is possible tosimilarly acquire other advantages mentioned in the seventh embodiment.

10. Tenth Embodiment

Hereinafter, a semiconductor storage device according to a tenthembodiment will be described. In the tenth embodiment, the tenthembodiment is different from the seventh embodiment and the eighthembodiment in that the select transistors are arranged in the honeycombshape, similarly to the ninth embodiment. In the tenth embodiment, theselectors are arranged similarly to the arrangement of the variableresistance elements described in the eighth embodiment. That is, thecenter of the selector in the xy-plane matches the center of thevariable resistance element in the tenth embodiment. Hereinafter,differences from the eighth embodiment will be described.

10.1 Stacked Structure of Memory Cell Array

A stacked structure of a memory cell array of the semiconductor storagedevice according to the tenth embodiment will be described below.

Initially, a layout of the memory cell array 11A in the xy-plane will bedescribed with reference to FIG. 43. FIG. 43 is a top view of the memorycell array 11A of the semiconductor storage device according to thetenth embodiment when viewed in the +z-axis direction.

As shown in FIG. 43, the arrangement of the wiring layers 61 and 62 andthe memory element layers 64 is the same as that of the eighthembodiment, and thus, the description is omitted.

The selection element layers 63 are arranged in the honeycomb shape inthe xy-plane. Specifically, the center of the selection element layer 63is disposed so as to match the center of the memory element layer 64 inthe xy-plane.

The selection element layers 63 are arranged in the honeycomb shape inthe xy-plane. Specifically, the selection element layers 63 are arrangedin vertices and a center of a regular hexagon of which a length of oneside is the distance d2 in the xy-plane. More specifically, theselection element layers 63 are arranged along the y-axis direction atequal intervals for every distance d2, and are arranged along the x-axisdirection at equal intervals for every distance 2 d 1. That is, the(n−1)-th-column selection element layer 63 and the (n+1)-th-columnselection element layer 63 are arranged in a similar order along thex-axis direction. The n-th-column selection element layer 63 and the(n+2)-th-column selection element layer 63 are arranged in a similarorder along the x-axis direction. However, the n-th-column selectionelement layer 63, the (n−1)-th-column selection element layer 63, andthe (n+1)-th-column selection element layer 63 are not arranged in thex-axis direction.

In the example of FIG. 43, a center of the selection element layer 63 isdisposed so as to match a center of the memory element layer 64 in thexy-plane. That is, the center of the n-th-column selection element layer63 is located in a position offset from the centers of the(n−1)-th-column and (n+1)-th-column selection element layers 63, alongthe y-axis direction by the distance d2/2.

The selection element layers are arranged in this manner, and thus, anarbitrary selection element layer 63 is disposed with equal distancesfrom six selection element layers 63 adjacent to the arbitrary selectionelement layer 63 in the xy-plane. Specifically, for example, sixselection element layers 63(m−1, n), 63(m+1, n), 63(m, n−1), 63(m+1,n−1), 63(m, n+1), and 63(m+1, n+1) adjacent to the selection elementlayer 63(m, n) are arranged in the vertices of the regular hexagon ofwhich one side is the distance d2, and the selection element layer 63(m,n) is disposed in the center of the regular hexagon. As another example,six selection element layers 63(m−1, n+1), 63(m+1, n+1), 63(m−1, n),63(m, n), 63(m−1, n+2), and 63(m, n+2) adjacent to the selection elementlayer 63(m, n+1) are arranged in the vertices of the regular hexagon ofwhich one side is the distance d2, and the selection element layer 63(m,n+1) is disposed in the center of the regular hexagon.

Hereinafter, configurations of sections of the memory cell array 11Adescribed in FIG. 43 which are taken along the xz-plane and the yz-planewill be described with reference to FIGS. 44A to 45B. FIGS. 44A to 45Bare examples of sectional views of a stacked structure of the memorycell array of the semiconductor storage device according to the tenthembodiment, which are taken along the xz-plane and the yz-plane.Specifically, FIGS. 44A to 45B show sections taken along a lineXXXXIVA-XXXXIVA, a line XXXXIVB-XXXXIVB, a line XXXXVA-XXXXVA, and aline XXXXVB-XXXXVB shown in FIG. 43. In the following description,differences between FIGS. 44A to 45B and FIGS. 38A to 39B will bedescribed.

Initially, the configuration of the section of the memory cell array 11Ataken along the xz-plane will be described with reference to FIGS. 44Aand 44B.

As shown in FIGS. 44A and 44B, the combination of the first regions R1and the second region R2 is formed so as to be separated from oneanother along the x-axis direction by the distance 2 d 1. Specifically,the first regions R1 are formed so as to reach the upper ends of thewiring layers 61 functioning as the word lines WL(n−1) and WL(n+1) inthe section taken along the line XXXXIVA-XXXXIVA. The first regions R1are formed so as to reach the upper ends of the wiring layers 61functioning as the word lines WLn and WL(n+2) in the section taken alongthe line XXXXIVB-XXXXIVB. The first region R1 in the section taken alongthe line XXXXIVA-XXXXIVA and the first region R1 in the section takenalong the line XXXXIVB-XXXXIVB are formed along the x-axis direction soas to be separated from each other by the distance d1.

Hereinafter, the configuration of the section of the memory cell array11A taken along the yz-plane will be described with reference to FIGS.45A and 45B.

As shown in FIGS. 45A and 45B, the first region R1 and the second regionR2 are formed such that the centers of the widths along the y-axisdirection match each other. The combinations of the first regions R1 andthe second regions R2 are formed along the y-axis direction so as to beseparated from one another by the distance d2. The combination of thefirst region R1 and the second region R2 is formed in a position, whichis offset from the center of the width of the wiring layer 62 along they-axis direction, in the +y-axis direction in the section taken alongthe line XXXXVA-XXXXVA, and is formed in a position, which is offsetfrom the center of the width of the wiring layer 62 along the y-axisdirection, in the −y-axis direction in the section taken along the lineXXXXVB-XXXXVB. The combination of the first region R1 and the secondregion R2 corresponding to the wiring layer 61 functioning as the wordline WL(n−1) and the combination of the first region R1 and the secondregion R2 corresponding to the wiring layer 61 functioning as the wordline WLn are formed along the y-axis direction so as to be offset fromeach other by the distance d2/2.

10.2 Advantage According to Present Embodiment

According to the tenth embodiment, the selectors SEL are disposed in thevertices and the center of the regular hexagon in the xy-plane.Specifically, the selectors SEL which correspond to the same word lineWL and are adjacent to each other are separated from each other alongthe y-axis direction by the distance d2. The selectors SEL whichcorrespond to the same bit line BL and are adjacent to each other areseparated from each other along the x-axis direction by the distance d1.The selector SEL which corresponds to the m-th-row bit line BL and then-th-column word line WL and the selector SEL which corresponds to them-th-row bit line BL and the (n+1)-th-column word line WL are separatedalong the y-axis direction by the distance d2/2. Accordingly, it ispossible to set the distances between all the selectors SEL adjacent toeach other to be equal. Thus, it is possible to reduce a manufacturingfluctuation in a manufacturing stage.

A center of the selector SEL matches a center of the variable resistanceelement VR in the xy-plane. Accordingly, it is possible to increase acontact area between the selector SEL and the variable resistanceelement VR. It is possible to further reduce an area occupied by thememory cell in the xy-plane.

In addition, according to the tenth embodiment, it is possible tosimilarly acquire other advantages mentioned in the eighth embodiment.

11. Eleventh Embodiment

Hereinafter, a semiconductor storage device according to an eleventhembodiment will be described. In the ninth embodiment, the selectors areoffset from the word lines in the same direction with the variableresistance elements, and thus, the selectors are arranged in thehoneycomb shape. In contrast, the eleventh embodiment is different fromthe ninth embodiment in that the selectors are offset from the word linein a direction opposite to a direction the variable resistance elementsare offset, and thus, the selectors are arranged in the honeycomb shape.That is, in the eleventh embodiment, when the center of the variableresistance element is offset from the word line in the +x-axisdirection, the center of the selector is offset from the word line inthe −x-axis direction. When the center of the variable resistanceelement is offset from the word line in the −x-axis direction, thecenter of the selector is offset from the word line in the +x-axisdirection. Hereinafter, differences from the ninth embodiment will bedescribed.

11.1 Stacked Structure of Memory Cell Array

A stacked structure of a memory cell array of the semiconductor storagedevice according to the eleventh embodiment will be described below.

Initially, a layout of the memory cell array 11A in the xy-plane will bedescribed with reference to FIG. 46. FIG. 46 is a top view of the memorycell array 11A of the semiconductor storage device according to theeleventh embodiment when viewed in the +z-axis direction.

As shown in FIG. 46, the arrangement of the wiring layers 61 and 62 andthe memory element layers 64 is the same as that of the ninthembodiment, and thus, the description is omitted.

The selection element layers 63 are arranged in the honeycomb shape inthe xy-plane. Specifically, the center of the selection element layer 63is disposed so as to be offset from the wiring layer 61 in a directionopposite to the direction in which the center of the memory elementlayer 64 is offset from the wiring layer in the xy-plane.

The selection element layers 63 are formed such that at least somethereof overlap in regions occupied by the wiring layers 61. Morespecifically, the center of the m-th-row selection element layer 63 islocated in a position which is offset from the center of the width ofthe corresponding wiring layer 61 along the x-axis direction, in the−x-axis direction. The centers of the (m−1)-th-row and (m+1)-th-rowselection element layers 63 are located in positions, which are offsetfrom the center of the width of the corresponding wiring layer 61 alongthe x-axis direction, in the +x-axis direction. The center of them-th-row selection element layer 63 is located in a position, which isoffset from the centers of the (m−1)-th-row and (m+1)-th-row selectionelement layers 63, along the x-axis direction by the distance d2/2.

The selection element layers are arranged in this manner, and thus, anarbitrary selection element layer 63 is disposed with equal distancesfrom six selection element layers 63 adjacent to the arbitrary selectionelement layer 63 in the xy-plane. Specifically, for example, sixselection element layers 63(m, n−1), 63(m, n+1), 63(m−1, n−1), 63(m−1,n), 63(m+1, n−1), and 63(m+1, n) adjacent to the selection element layer63(m, n) are arranged in the vertices of the regular hexagon of whichone side is the distance d2, and the selection element layer 63(m, n) isdisposed in the center of the regular hexagon. As another example, sixselection element layers 63(m+1, n−1), 63(m+1, n+1), 63(m, n), 63(m,n+1), 63(m+2, n), and 63(m+2, n+1) adjacent to the selection elementlayer 63(m+1, n) are arranged in the vertices of the regular hexagon ofwhich one side is the distance d2, and the selection element layer63(m+1, n) is disposed in the center of the regular hexagon.

In the example of FIG. 46, the memory element layer 64 and the selectionelement layer 63 do not overlap and are separate from each other in thexy-plane. Thus, an internal connection layer 67 is further formedbetween the memory element layer 64 and the selection element layer 63such that the memory element layer 64 and the selection element layer 63are connected to each other. For example, the internal connection layer67 has an oval shape so as to overlap both the memory element layer 64and the selection element layer 63 in the xy-plane.

Hereinafter, configurations of sections of the memory cell array 11Adescribed in FIG. 46 which are taken along the xz-plane and the yz-planewill be described with reference to FIGS. 47A to 48B. FIGS. 47A to 48Bare examples of sectional views of a stacked structure of the memorycell array of the semiconductor storage device according to the eleventhembodiment, which are taken along the xz-plane and the yz-plane.Specifically, FIGS. 47A to 48B show sections taken along a lineXXXXVIIA-XXXXVIIA, a line XXXXVIIB-XXXXVIIB, a line XXXXVIIIA-XXXXVIIIA,and a line XXXXVIIIB-XXXXVIIIB shown in FIG. 46. In the followingdescription, differences between FIGS. 47A to 48B and FIGS. 41A to 42Bwill be described.

Initially, the configuration of the section of the memory cell array 11Ataken along the xz-plane will be described with reference to FIGS. 47Aand 47B.

As shown in FIGS. 47A and 47B, the first region R1 is formed so as toreach a part of an upper end of the wiring layer 61. Specifically, thefirst region R1 reaches a part of the upper end of the wiring layer 61on the +x-axis in the section taken along the line XXXXVIIA-XXXXVIIA,and reaches a part of the upper end of the wiring layer 61 on the−x-axis in the section taken along the line XXXXVIIB-XXXXVIIB. A centerof a width of the first region R1 along the x-axis direction isdifferent from a center of a width of the second region R2 formedimmediately above the first region R1 along the x-axis direction.

That is, in the section taken along the line XXXXVIIA-XXXXVIIA, thesecond region R2 is formed so as to be offset from the wiring layer 61in the −x-axis direction, and the first region R1 is formed so as to beoffset from the wiring layer 61 in the +x-axis direction. In the sectiontaken along the line XXXXVIIB-XXXXVIIB, the second region R2 is formedso as to be offset from the wiring layer 61 in the +x-axis direction,and the first region R1 is formed so as to be offset from the wiringlayer 61 in the −x-axis direction. The first region R1 and the secondregion R2 in the section taken along the line XXXXVIIA-XXXXVIIA and thefirst region R1 and the second region R2 in the section taken along theline XXXXVIIB-XXXXVIIB are formed along the x-axis direction so as to beoffset from each other by the distance d2/2.

The internal connection layer 67 is formed on an upper end of theselection element layer 63. The internal connection layer 67 furtherextends toward the −x-axis direction than the selector SEL in thesection taken along the line XXXXVIIA-XXXXVIIA, and further extendstoward the +x-axis direction than the selector SEL in the section takenalong the line XXXXVIIB-XXXXVIIB. The second region R2 is formed on anupper end of the internal connection layer 67.

Hereinafter, the configuration of the section of the memory cell array11A taken along the yz-plane will be described with reference to FIGS.48A and 48B.

As shown in FIGS. 48A and 48B, the first regions R1 are formed along they-axis direction so as to be separated from one another by the distance2 d 1. Specifically, the first regions R1 are formed under the wiringlayer 62 functioning as the bit lines BL(m+1) and BL(m−1) in the sectiontaken along the line XXXXVIIIA-XXXXVIIIA. Specifically, the firstregions R1 are formed under the wiring layers 62 functioning as the bitlines BL(m+2) and BLm in the section taken along the lineXXXXVIIIB-XXXXVIIIB. The first region R1 in the section taken along theline XXXXVIIA-XXXXVIIA and the first region R1 in the section takenalong the line XXXXVIIB-XXXXVIIB are formed along the y-axis directionso as to be separated from each other by the distance d1.

The internal connection layer 67 is formed in an upper end of theselection element layer 63 and a lower end of the conductive layer 65.For example, a center of the internal connection layer 67 along they-axis direction matches centers of widths of the first region R1 andthe second region R2 along the y-axis direction.

11.2 Advantage According to Present Embodiment

According to the eleventh embodiment, when the variable resistanceelement VR is offset from the center of the width of the correspondingword line WL along the x-axis direction in the +x-axis direction, theselector SEL is offset from the center of the width of the correspondingword line WL along the x-axis direction in the −x-axis direction. Whenthe variable resistance element VR is offset from the center of thewidth of the corresponding word line WL along the x-axis direction inthe −x-axis direction, the selector SEL is offset from the center of thewidth of the corresponding word line WL along the x-axis direction inthe +x-axis direction. The selectors SEL are disposed in the verticesand the center of the regular hexagon in the xy-plane. Accordingly, theselector SEL does not overlap the variable resistance element VR in thexy-plane. Thus, it is possible to form the variable resistance elementVR on a base portion in which the selector SEL is not present.Accordingly, it is possible to reduce a characteristic fluctuation ofthe variable resistance element VR in manufacturing the variableresistance element.

The internal connection layer 67 is formed between the selector SEL andthe variable resistance element VR. The internal connection layer 67overlaps both the selector SEL and the variable resistance element VR inthe xy-plane. Accordingly, it is possible to connect the selector SELand the variable resistance element VR.

In addition, according to the eleventh embodiment, it is possible tosimilarly acquire other advantages mentioned in the ninth embodiment.

12. Twelfth Embodiment

Hereinafter, a semiconductor storage device according to a twelfthembodiment will be described. In the tenth embodiment, the selectors areoffset from the word lines in the same direction with the variableresistance elements, and thus, the selectors are arranged in thehoneycomb shape. In contrast, the twelfth embodiment is different fromthe tenth embodiment in that the selectors are offset from the word linein a direction opposite to a direction the variable resistance elementsare offset, and thus, the selectors are arranged in the honeycomb shape.That is, in the twelfth embodiment, when the center of the variableresistance element is offset from the bit line in the +y-axis direction,the center of the selector is offset from the bit line in the −y-axisdirection. When the center of the variable resistance element is offsetfrom the bit line in the −y-axis direction, the center of the selectoris offset from the bit line in the +y-axis direction. Hereinafter,differences from the tenth embodiment will be described.

12.1 Stacked Structure of Memory Cell Array

A stacked structure of a memory cell array of the semiconductor storagedevice according to the twelfth embodiment will be described below.

Initially, a layout of the memory cell array 11A in the xy-plane will bedescribed with reference to FIG. 49. FIG. 49 is a top view of the memorycell array 11A of the semiconductor storage device according to thetwelfth embodiment when viewed in the +z-axis direction.

As shown in FIG. 49, the arrangement of the wiring layers 61 and 62 andthe memory element layers 64 is the same as that of the tenthembodiment, and thus, the description is omitted.

The selection element layers 63 are arranged in the honeycomb shape inthe xy-plane. Specifically, the center of the selection element layer 63is disposed so as to be offset from the wiring layer 62 in a directionopposite to the direction in which the center of the memory elementlayer 64 is offset from the wiring layers in the xy-plane.

In FIG. 49, the selection element layers 63 are formed such that atleast some thereof overlap in regions occupied by the wiring layers 62.More specifically, the center of the n-th-column selection element layer63 is located in a position, which is offset from the center of thewidth of the corresponding wiring layer 62 along the y-axis direction,in the +y-axis direction. The centers of the (n−1)-th-column and(n+1)-th-column selection element layers 63 are located in positions,which are offset from the center of the width of the correspondingwiring layer 62 along the y-axis direction, in the −y-axis direction.The center of the n-th-column selection element layer 63 is located in aposition offset from the centers of the (n−1)-th-column and(n+1)-th-column selection element layers 63, along the y-axis directionby the distance d2/2.

The selection element layers are arranged in this manner, and thus, anarbitrary selection element layer 63 is disposed with equal distancesfrom six selection element layers 63 adjacent to the arbitrary selectionelement layer 63 in the xy-plane. Specifically, for example, sixselection element layers 63(m−1, n), 63(m+1, n), 63(m−1, n−1), 63(m,n−1), 63(m−1, n+1), and 63(m, n+1) adjacent to the selection elementlayer 63(m, n) are arranged in the vertices of the regular hexagon ofwhich one side is the distance d2, and the selection element layer 63(m,n) is disposed in the center of the regular hexagon. As another example,six selection element layers 63(m−1, n+1), 63(m+1, n+1), 63(m, n),63(m+1, n), 63(m, n+2), and 63(m+1, n+2) adjacent to the selectionelement layer 63(m, n+1) are arranged in the vertices of the regularhexagon of which one side is the distance d2, and the selection elementlayer 63(m, n+1) is disposed in the center of the regular hexagon.

In the example of FIG. 49, the memory element layer 64 and the selectionelement layer 63 do not overlap and are separate from each other in thexy-plane. Thus, an internal connection layer 67 is further formedbetween the memory element layer 64 and the selection element layer 63such that the memory element layer 64 and the selection element layer 63are connected to each other. For example, the internal connection layer67 has an oval shape so as to overlap both the memory element layer 64and the selection element layer 63 in the xy-plane.

Hereinafter, configurations of sections of the memory cell array 11Adescribed in FIG. 49 which are taken along the xz-plane and the yz-planewill be described with reference to FIGS. 50A to 51B. FIGS. 50A to 51Bare examples of sectional views of a stacked structure of the memorycell array of the semiconductor storage device according to the twelfthembodiment, which are taken along the xz-plane and the yz-plane.Specifically, FIGS. 50A to 51B show sections taken along a lineXXXXXA-XXXXXA, a line XXXXXB-XXXXXB, a line XXXXXIA-XXXXXIA, and a lineXXXXXIB-XXXXXIB shown in FIG. 49. In the following description,differences between FIGS. 50A to 51B and FIGS. 44A to 45B will bedescribed.

Initially, the configuration of the section of the memory cell array 11Ataken along the xz-plane will be described with reference to FIGS. 50Aand 50B.

As shown in FIGS. 50A and 50B, the first regions R1 is formed so as tobe separated from one another along the x-axis direction by the distance2 d 1. Specifically, the first regions R1 are formed so as to reach theupper ends of the wiring layers 61 functioning as the word lines WLn andWL(n+2) in the section taken along the line XXXXXA-XXXXXA. The firstregions R1 are formed so as to reach the upper ends of the wiring layers61 functioning as the word lines WL(n−1) and WL(n+1) in the sectiontaken along the line XXXXXB-XXXXXB. The first region R1 in the sectiontaken along the line XXXXXA-XXXXXA and the first region R1 in thesection taken along the line XXXXXB-XXXXXB are formed along the x-axisdirection so as to be separated from each other by the distance d1.

The internal connection layer 67 is located in an upper end of theselection element layer 63 and a lower end of the conductive layer 65.The center of the width of the internal connection layer 67 along thex-axis direction matches the centers of the widths of the first regionR1 and the second region R2 along the x-axis direction.

Hereinafter, the configuration of the section of the memory cell array11A taken along the yz-plane will be described with reference to FIGS.51A and 51B.

As shown in FIGS. 51A and 51B, the first region R1 is formed so as to beoffset from the wiring layer 62 in the −y-axis direction in the sectiontaken along the line XXXXXIA-XXXXXIA, and is formed so as to be offsetfrom the wiring layer 62 in the +y-axis direction in the section takenalong the line XXXXXIB-XXXXXIB. The first region R1 in the section takenalong the line XXXXXIA-XXXXXIA and the first region R1 in the sectiontaken along the line XXXXXIB-XXXXXIB are formed along the y-axisdirection so as to be separated from each other by the distance d2/2.

The internal connection layer 67 further extends toward the +y-axisdirection than the first region R1 in the section taken along the lineXXXXXIA-XXXXXIA, and further extends toward the −y-axis direction thanthe first region R1 in the section taken along the line XXXXXIB-XXXXXIB.The second region R2 is formed on an upper end of the internalconnection layer 36.

12.2 Advantage According to Present Embodiment

According to the twelfth embodiment, when the variable resistanceelement VR is offset from the center of the width of the correspondingbit line BL along the y-axis direction in the +y-axis direction, theselector SEL is offset from the center of the width of the correspondingbit line BL along the y-axis direction in the −y-axis direction. Whenthe variable resistance element VR is offset from the center of thewidth of the corresponding bit line BL along the y-axis direction in the−y-axis direction, the selector SEL is offset from the center of thewidth of the corresponding bit line BL along the y-axis direction in the+y-axis direction. The selectors SEL are disposed in the vertices andthe center of the regular hexagon in the xy-plane. Accordingly, theselector SEL does not overlap the variable resistance element VR in thexy-plane. Thus, it is possible to form the variable resistance elementVR on a base portion in which the selector SEL is not present.Accordingly, it is possible to reduce a characteristic fluctuation ofthe variable resistance element VR in manufacturing the variableresistance element.

The internal connection layer 67 is formed between the selector SEL andthe variable resistance element VR. The internal connection layer 67overlaps both the selector SEL and the variable resistance element VR inthe xy-plane. Accordingly, it is possible to connect the selector SELand the variable resistance element VR.

In addition, according to the twelfth embodiment, it is possible tosimilarly acquire other advantages mentioned in the tenth embodiment.

13. Thirteenth Embodiment

Hereinafter, a semiconductor storage device according to a thirteenthembodiment will be described. In the seventh embodiment to the twelfthembodiment, the configuration in which the memory cell includes theselector including the first end connected to the bit line and thesecond end connected to the first end of the variable resistance elementand the variable resistance element including the second end connectedto the word line is described. In contrast, in the thirteenthembodiment, a memory cell includes a selector including a first endconnected to the word line and a second end connected to the first endof the variable resistance element and a variable resistance elementincluding a second end connected to the bit line. The thirteenthembodiment is different from the seventh embodiment to the twelfthembodiment in that the memory cells are formed in two layers in thez-axis direction. Hereinafter, differences from the seventh embodimentwill be described.

13.1 Stacked Structure of Memory Cell Array

Hereinafter, a stacked structure of a memory cell array of thesemiconductor storage device according to the thirteenth embodiment willbe described.

Initially, a layout of the memory cell array 11A in the xy-plane will bedescribed with reference to FIG. 52. FIG. 52 is a top view of the memorycell array 11A of the semiconductor storage device according to thethirteenth embodiment when viewed in the +z-axis direction.

For example, as shown in FIG. 52, the plurality of wiring layers 62Afunctioning as first bit lines BL1 extends along the x-axis direction,and are arranged along the y-axis direction at equal intervals. In theexample of FIG. 52, four wiring layers 62A corresponding to an(m−1)-th-row first bit line BL1(m−1), an m-th-row first bit line BL1 m,an (m+1)-th-row first bit line BL1(m+1), and an (m+2)-th-row first bitline BL1(m+2) are illustrated. Two wiring layers 62A adjacent to eachother are separated from each other along the y-axis direction by thedistance d1.

The wiring layer 61 is formed above the wiring layer 62A.

A plurality of wiring layers 62B each functioning as a second bit lineBL2 is formed above the wiring layers 61. For example, the wiring layers62B extend along the x-axis direction, and are arranged along the y-axisdirection at equal intervals. In the example of FIG. 52, four wiringlayers 62B corresponding to an (m−1)-th-row second bit line BL2(m−1), anm-th-row second bit line BL2 m, an (m+1)-th-row second bit lineBL2(m+1), and an (m+2)-th-row second bit line BL2(m+2) are illustrated.Specifically, two wiring layers 62B adjacent to each other are separatedfrom each other along the y-axis direction by the distance d1.

For example, the wiring layers 62A and 62B are formed in a region inwhich the wiring layers overlap each other in the xy-plane.

In FIG. 52, selection element layers 63A and 63B functioning asselectors SEL1 and SEL2 are formed in regions in which the wiring layers62A and 62B intersect with the wiring layer 61. For example, theselection element layers 63A and 63B each have a cylindrical shape thatextends along the z-axis direction. The selection element layer 63A isformed between the wiring layer 62A and the wiring layer 61, and theselection element layer 63B is formed between the wiring layer 61 andthe wiring layer 62B. In the example of FIG. 52, the selection elementlayers 63A and 63B locate coaxially in the xy-plane. Selection elementlayers 63A and 63B are arranged in a rectangular grid in the xy-plane.The arrangement of the selection element layers 63A and 63B in thexy-plane is the same as that of the selection element layers 63 in theseventh embodiment, and thus, the description thereof will be omitted.

In FIG. 52, memory element layers 64A and 64B functioning as variableresistance elements VR1 and VR2 are formed in a region including a partof a region in which the wiring layers 62A and 62B intersect with thewiring layer 61. For example, the memory element layers 64A and 64B eachhave a cylindrical shape that extends along the z-axis direction. Thememory element layer 64A is formed between the wiring layer 62A and thewiring layer 61, and the memory element layer 64B is formed between thewiring layer 61 and the wiring layer 62B. In the example of FIG. 52, thememory element layers 64A and 64B locate coaxially in the xy-plane.Memory element layers 64A and 64B are disposed in a honeycomb shape inthe xy-plane. The arrangement of the memory element layers 64A and 64Bin the xy-plane is the same as that of the memory element layers 64 inthe seventh embodiment, and thus, the description thereof will beomitted.

Hereinafter, configurations of sections of the memory cell array 11Adescribed in FIG. 52, which are taken along the xz-plane and theyz-plane, will be described with reference to FIGS. 53 and 54. FIGS. 53and 54 are examples of sectional views of a stacked structure of thememory cell array of the semiconductor storage device according to thethirteenth embodiment, which are taken along the xz-plane and theyz-plane. Specifically, FIGS. 53 and 54 show sections taken along a lineXXXXXI II-XXXXXII I and a line XXXXXIV-XXXXXIV shown in FIG. 52. InFIGS. 53 and 54, some insulating layers are omitted for simplicity ofillustration.

Initially, the configuration of the section of the memory cell array 11Ataken along the xz-plane will be described with reference to FIG. 53.

As shown in FIG. 53, the wiring layer 62A functioning as the first bitline BL1(m−1) is formed on the semiconductor substrate 30 in the sectiontaken along the line XXXXXIII-XXXXXIII. An insulating film (not shown)is formed on top surfaces of the wiring layers 62A.

First regions R1 are respectively formed in a plurality of regions inwhich the selectors SEL1 are formed. The first regions R1 are formedalong the x-axis direction so as to be separated from one another by thedistance d2. For example, the selection element layer 63A including asemiconductor layer functioning as the selector SEL1 is formed withinthe first region R1. In the example of FIG. 53, the selection elementlayer 63A has, for example, non-linear characteristics that allow acurrent to easily flow to the wiring layer 61 from the wiring layer 62Aand a current to hardly flow to the wiring layer 62A from the wiringlayer 61. An insulating film (not shown) is formed in a layer on anupper end of the selection element layer 63A.

Second regions R2 are respectively formed in a plurality of regions inwhich the variable resistance elements VR1 are formed. The secondregions R2 are formed along the x-axis direction so as to be separatedfrom one another by the distance d2. Each second region R2 reaches apart of the upper end of the selection element layer 63A. A conductivelayer 65A, the memory element layer 64A, and a conductive layer 66A aresequentially stacked within the second region R2. The memory elementlayer 64A functions as the variable resistance element VR1. Theconductive layers 65A and 66A function as a lower electrode and an upperelectrode of the variable resistance element VR1, respectively.Accordingly, a one-side end of the variable resistance element VR1 andthe other-side end of the selector SEL1 are connected to each other.

The plurality of wiring layers 61 functioning as the word lines WL(n−1),WLn, WL(n+1), and WL(n+2) is formed in a layer on an upper end of theconductive layer 66A at equal intervals by the distance d2. The wiringlayer 61 is connected to a part of an upper end of the conductive layer66A. The center of the width of the wiring layer 61 along the x-axisdirection matches the center of the width of the selection element layer63A along the x-axis direction. The wiring layer 61 is commonlyconnected to the other-side ends of the variable resistance elements VRof the plurality of memory cells MC arranged along the x-axis direction.An insulating film (not shown) is formed on top surfaces of the wiringlayers 61.

Third regions R3 are formed in a plurality of regions in which selectorsSEL2 are formed. The third regions R3 are formed along the x-axisdirection so as to be separated from one another by the distance d2. Forexample, the selection element layer 63B functioning as the selectorSEL2 is formed within the third region R3. In the example of FIG. 53,the selection element layer 63B has, for example, non-linearcharacteristics that allow a current to easily flow to the wiring layer61 from the wiring layer 62B and a current to hardly flow to the wiringlayer 62B from the wiring layer 61. A center of a width of the thirdregion R3 along the x-axis direction is different from a center of awidth of the wiring layer 61 and the first region R1 formed immediatelyunder the third region R3 along the x-axis direction. An insulating film(not shown) is formed in a layer on an upper end of the selectionelement layer 63B.

Fourth regions R4 are formed in a plurality of regions in which variableresistance elements VR2 are formed. The fourth regions R4 are formedalong the x-axis direction so as to be separated from one another by thedistance d2. Each fourth region R4 reaches apart of the upper end of theselection element layer 63B. A conductive layer 65B, the memory elementlayer 64B, and a conductive layer 66B are sequentially stacked withinthe fourth region R4. The memory element layer 64B functions as thevariable resistance element VR2. The conductive layers 65B and 66Bfunction as a lower electrode and an upper electrode of the variableresistance element VR2, respectively. Accordingly, a one-side end of thevariable resistance element VR2 and the other-side end of the selectorSEL2 are connected to each other.

The wiring layer 62B functioning as the second bit line BL2(m−1) isformed in a layer on an upper end of the conductive layer 66B.

The second region R2 and the fourth region R4 are respectively formed soas to be offset from the first region R1 and the third region R3 in thex-axis direction while maintaining a state in which the conductivelayers 65A and 65B are electrically connected to the selection elementlayers 63A and 63B. Specifically, the second region R2 and the fourthregion R4 are formed so as to be offset from the first region R1 and thethird region R3 in the −x-axis direction.

Hereinafter, the configuration of the section of the memory cell array11A taken along the yz-plane will be described with reference to FIG.54.

As shown in FIG. 54, the plurality of wiring layers 62A functioning asthe first bit lines BL1(m+2), BL1(m+1), BL1 m, and BL1(m−1) is formed onthe semiconductor substrate 30.

The first regions R1 are formed along the y-axis direction so as to beseparated from one another by the distance d1. The selector SEL1 havingthe same configuration as that of the selector SEL1 described in FIG. 54is formed in the first region R1.

The second regions R2 are formed along the y-axis direction so as to beseparated from one another by the distance 2 d 1. Specifically, thesecond regions R2 are formed above the wiring layers 62A functioning asthe first bit lines BL1(m+2) and BL1 m in the section taken along theline XXXXXIV-XXXXXIV. A center of a width of the second region R2 alongthe y-axis direction matches a center of a width of the first region R1formed immediately under the second region R2 along the y-axisdirection. That is, the second region R2 formed above the wiring layer62A functioning as the first bit line BL1(m+2) and the first region R1formed on the wiring layer 62A functioning as the first bit lineBL1(m+1) are formed along the y-axis direction so as to be separatedfrom each other by the distance d1. The variable resistance element VR1having the same configuration as that of the variable resistance elementVR1 described in FIG. 53 is formed in the second region R2.

The wiring layer 61 is formed in the layer on the upper end of theconductive layer 66A.

The third regions R3 are formed along the y-axis direction so as to beseparated from one another by the distance d1. The selector SEL2 havingthe same configuration as that of the selector SEL2 described in FIG. 54is formed in the third region R3. A center of a width of the thirdregion R3 along the y-axis direction matches centers of widths of thefirst region R1, the second region R2, and the wiring layer 62A formedimmediately under the third region R3 along the y-axis direction.

The fourth regions R4 are formed along the y-axis direction so as to beseparated from one another by the distance 2 d 1. Specifically, thefourth regions R4 are formed under the wiring layers 62B functioning asthe second bit lines BL2(m+2) and BL2 m in the section taken along theline XXXXXIV-XXXXXIV. A center of a width of the fourth region R4 alongthe y-axis direction matches centers of widths of the third region R3,the second region R2, the first region R1, and the wiring layer 62Aformed immediately under the fourth region R4 along the y-axisdirection. That is, the fourth region R4 formed under the wiring layer62B functioning as the second bit line BL2(m+2) and the third region R3formed above the wiring layer 62 functioning as the first bit lineBL1(m+1) are formed along the y-axis direction so as to be separatedfrom each other by the distance d1. The variable resistance element VR2having the same configuration as that of the variable resistance elementVR2 described in FIG. 53 is formed in the fourth region R4.

The plurality of wiring layers 62B functioning as the second bit lineBL2(m+2), BL2(m+1), BL2 m, and BL2(m−1) is formed in the layer of theupper end of the conductive layer 66B.

13.2 Advantage According to Present Embodiment

According to the thirteenth embodiment, the variable resistance elementsVR1 and VR2 are disposed in the vertices and the center of the regularhexagon in the xy-plane. Specifically, the variable resistance elementsVR1 which correspond to the same first bit line BL1 and are adjacent toeach other are separated along the x-axis direction by the distance d2.The variable resistance elements VR1 which correspond to the same wordline WL and are adjacent to each other are separated from each otheralong the y-axis direction by the distance d1. The variable resistanceelement VR1 which corresponds to the m-th-row first bit line BL1 and then-th-column word line WL and the variable resistance element VR1 whichcorresponds to the (m+1)-th-row first bit line BL1 and the n-th-columnword line WL are separated along the x-axis direction by the distanced2/2. Accordingly, it is possible to set the distances between all thevariable resistance elements VR1 adjacent to each other to be equal. Thevariable resistance elements VR2 which correspond to the same second bitline BL2 and are adjacent to each other are separated along the x-axisdirection by the distance d2. The variable resistance elements VR2 whichcorrespond to the same word line WL and are adjacent to each other areseparated from each other along the y-axis direction by the distance d1.The variable resistance element VR2 which corresponds to the m-th-rowsecond bit line BL2 and the n-th-column word line WL and the variableresistance element VR2 which corresponds to the (m+1)-th-row second bitline BL2 and the n-th-column word line WL are separated along the x-axisdirection by the distance d2/2. Accordingly, it is possible to set thedistances between all the variable resistance elements VR1 adjacent toeach other and the distances between all the variable resistanceelements VR2 adjacent to each other to be equal. Thus, a manufacturingfluctuation in a manufacturing stage can be reduced in the embodimentcompared to the arrangement in which the distances between all thevariable resistance elements adjacent to each other are not equal, suchas in the case of the memory cells arranged in the rectangular grid.

The variable resistance elements 63A and 63B have opposite-orientationcharacteristics along the z-axis direction. Specifically, the selectionelement layer 63A allows a current to easily flow to the wiring layer 61from the wiring layer 62A and a current to hardly flow to the wiringlayer 62A from the wiring layer 61. The selection element layer 63Ballows a current to easily flow to the wiring layer 61 from the wiringlayer 62B and a current to hardly flow to the wiring layer 62B from thewiring layer 61. Accordingly, it is possible to form the memory cellarray of the semiconductor storage device according to the seventhembodiment in two layers in the z-axis direction. Thus, it is possibleto further improve a degree of integration of the memory cells.

In addition, according to the seventh embodiment, it is possible tosimilarly acquire other advantages mentioned in the first embodiment.

14. Modification Examples

The storage devices described herein are not limited to the formsmentioned in the above-described embodiments, and may be embodied in avariety of changes. Although it is described in the first embodiment tothe sixth embodiment that the conductive layers 44 and 45 have the samesection as that of the memory element layer 20 taken along the xy-plane,these embodiments are not limited thereto. For example, the conductivelayers may have sections different from that of the memory element layer20.

FIGS. 55A and 55B are sectional views for describing a sectionalstructure of a memory cell of a semiconductor storage device accordingto another modification example. FIGS. 55A and 55B show sectional viewsof the memory cell cut by a plane parallel to the z-axis direction. FIG.55A shows a case where the magnetic tunnel junction element MTJ isformed above the select transistor ST, and FIG. 55B shows a case wherethe magnetic tunnel junction element MTJ is formed under the selecttransistor ST.

As shown in FIG. 55A, a conductive layer 44A may include a top surfaceof the diffusion layer 43 in the bottom surface. Also, the conductivelayer 44A may include a bottom surface of the memory element layer 20 inthe top surface. Likewise a conductive layer 45A may include a topsurface of the memory element layer 20 in the bottom surface. Also, theconductive layer 45A may include a bottom surface of the wiring layer 33in the top surface.

As shown in FIG. 55B, a conductive layer 44B may include a top surfaceof the wiring layer 31 in the bottom surface. Also, the conductive layer44B may the bottom surface of the memory element layer 20 in the topsurface. Likewise a conductive layer 45B may include the top surface ofthe memory element layer 20 in the bottom surface. Also, the conductivelayer 45B may include a bottom surface of the diffusion layer 41 in thetop surface.

The conductive layers are formed in this manner, and thus, it ispossible to increase a contact area between the magnetic tunnel junctionelement MTJ and the select transistor ST. Accordingly, it is possible toreduce a wiring resistance.

The above-described modification example may be similarly applied to theseventh embodiment to the thirteenth embodiment. Accordingly, it ispossible to acquire the same advantages for the seventh embodiment tothe thirteenth embodiment.

Although it is described that the magnetic tunnel junction elementmentioned in the first embodiment to the sixth embodiment and themodification examples thereof is a bottom-free type in which thereference layer is formed above the memory layer, the magnetic tunneljunction element may be a top-free type in which the memory layer isformed above the reference layer.

Although it is described in the first embodiment to the sixth embodimentand the modification examples thereof that the MRAM using the magnetictunnel junction element MTJ is used as the semiconductor storage device,these embodiments are not limited thereto. For example, theseembodiments may be applied to the same variable resistance memory as theMRAM, for example, the semiconductor storage device including theelement that stores data by using a resistance change like ReRAM orPCRAM.

While certain embodiments have been described, these embodiments havebeen presented by way of example only, and are not intended to limit thescope of the inventions. Indeed, the novel embodiments described hereinmay be embodied in a variety of other forms; furthermore, variousomissions, substitutions and changes in the form of the embodimentsdescribed herein maybe made without departing from the spirit of theinventions. The accompanying claims and their equivalents are intendedto cover such forms or modifications as would fall within the scope andspirit of the inventions.

What is claimed is:
 1. A semiconductor storage device comprising: asubstrate; a first wiring and a second wiring that are in a first layerabove the substrate, extend along a first direction that is parallel toa surface of the substrate, and are adjacent to each other along asecond direction that intersects with the first direction and isparallel to the surface of the substrate; a third wiring and a fourthwiring that are in a second layer above the first layer, extend alongthe second direction, and are adjacent to each other along the firstdirection; a first memory cell and a second memory cell on a surface ofthe first wiring; and a third memory cell on a surface on the secondwiring, wherein the first memory cell, the second memory cell, and thethird memory cell each include a variable resistance element and aswitching element, the switching element of the first memory cell havinga gate coupled to the third wiring, and the switching element of thesecond memory cell and the switching element of the third memory celleach having a gate coupled to the fourth wiring, and the variableresistance element of the first memory cell, the variable resistanceelement of the second memory cell, and the variable resistance elementof the third memory cell are formed with equal distances from each otherin a plane parallel to the surface of the substrate.
 2. Thesemiconductor storage device according to claim 1, wherein the variableresistance element of the first memory cell and the variable resistanceelement of the second memory cell are aligned in the first direction. 3.The semiconductor storage device according to claim 2, wherein theswitching element of the second memory cell and the switching element ofthe third memory cell are aligned in the second direction.
 4. Thesemiconductor storage device according to claim 2, further comprising: afourth memory cell on the surface of the second wiring, the fourthmemory cell including a variable resistance element and a switchingelement, wherein the switching element of the fourth memory cellincludes a gate coupled to the third wiring, and the variable resistanceelement of the first memory cell, the variable resistance element of thethird memory cell, and the variable resistance element of the fourthmemory cell are located with equal distances from each other in theplane parallel to the surface of the substrate.
 5. The semiconductorstorage device according to claim 4, wherein the switching element ofthe first memory cell, the switching element of the second memory cell,and the switching element of the third memory cell are located withequal distances from each other in the plane parallel to the surface ofthe substrate, and the switching element of the first memory cell, theswitching element of the third memory cell, and the switching element ofthe fourth memory cell are located with equal distances from each otherin the plane parallel to the surface of the substrate.
 6. Thesemiconductor storage device according to claim 1, wherein the variableresistance element of the second memory cell and the variable resistanceelement of the third memory cell are aligned in the second direction. 7.The semiconductor storage device according to claim 6, wherein theswitching element of the first memory cell and the switching element ofthe second memory cell are aligned in the first direction.
 8. Thesemiconductor storage device according to claim 6, further comprising: afourth memory cell on the surface of the second wiring, the fourthmemory cell including a variable resistance element and a switchingelement, wherein the switching element of the fourth memory cellincludes a gate coupled to the third wiring, and the variable resistanceelement of the first memory cell, the variable resistance element of thethird memory cell, and the variable resistance element of the fourthmemory cell are located with equal distances from each other in theplane parallel to the surface of the substrate.
 9. The semiconductorstorage device according to claim 8, wherein the switching element ofthe first memory cell, the switching element of the second memory cell,and the switching element of the third memory cell are located withequal distances from each other in the plane parallel to the surface ofthe substrate, and the switching element of the first memory cell, theswitching element of the third memory cell, and the switching element ofthe fourth memory cell are located with equal distances in the planeparallel to the surface of the substrate.
 10. The semiconductor storagedevice according to claim 1, wherein the switching elements are betweenthe substrate and the variable resistance elements.
 11. Thesemiconductor storage device according to claim 1, wherein the variableresistance elements are between the substrate and the switchingelements.
 12. A semiconductor storage device comprising: a substrate; afirst wiring and a second wiring that are in a first layer above thesubstrate, extend along a first direction that is parallel to a surfaceof the substrate, and are adjacent to each other along a seconddirection that intersects with the first direction and is parallel tothe surface of the substrate; a third wiring and a fourth wiring thatare in a second layer above the first layer, extend along the seconddirection, and are adjacent to each other along the first direction; afirst memory cell between the first wiring and the third wiring; asecond memory cell between the second wiring and the third wiring; and athird memory cell between the second wiring and the fourth wiring,wherein the first memory cell, the second memory cell, and the thirdmemory cell each include a variable resistance element and a switchingelement, and the variable resistance element of the first memory cell,the variable resistance element of the second memory cell, and thevariable resistance element of the third memory cell are located withequal distances from each other in a plane parallel to the surface ofthe substrate.
 13. The semiconductor storage device according to claim12, wherein the variable resistance element of the first memory cell andthe variable resistance element of the second memory cell are aligned inthe second direction.
 14. The semiconductor storage device according toclaim 13, wherein the switching element of the second memory cell andthe switching element of the third memory cell are aligned in the firstdirection.
 15. The semiconductor storage device according to claim 13,further comprising: a fourth memory cell between the first wiring andthe fourth wiring, the fourth memory cell including a variableresistance element and a switching element, wherein the variableresistance element of the first memory cell, the variable resistanceelement of the third memory cell, and the variable resistance element ofthe fourth memory cell are located with equal distances from each otherin a plane parallel to the surface of the substrate.
 16. Thesemiconductor storage device according to claim 15, wherein theswitching element of the first memory cell, the switching element of thesecond memory cell, and the switching element of the third memory cellare located with equal distances from each other in the plane parallelto the surface of the substrate, and the switching element of the firstmemory cell, the switching element of the third memory cell, and theswitching element of the fourth memory cell are located with equaldistances from each other in the plane parallel to the surface of thesubstrate.
 17. The semiconductor storage device according to claim 12,wherein the variable resistance element of the second memory cell andthe variable resistance element of the third memory cell are aligned inthe first direction.
 18. The semiconductor storage device according toclaim 17, wherein the switching element of the first memory cell and theswitching element of the second memory cell are aligned in the seconddirection.
 19. The semiconductor storage device according to claim 18,further comprising: a fourth memory cell between the first wiring andthe fourth wiring, the fourth memory cell including a variableresistance element and a switching element, wherein the variableresistance element of the first memory cell, the variable resistanceelement of the third memory cell, and the variable resistance element ofthe fourth memory cell are located with equal distances from each otherin a plane parallel to the surface of the substrate.
 20. Thesemiconductor storage device according to claim 19, wherein theswitching element of the first memory cell, the switching element of thesecond memory cell, and the switching element of the third memory cellare located with equal distances from each other in the plane parallelto the surface of the substrate, and the switching element of the firstmemory cell, the switching element of the third memory cell, and theswitching element of the fourth memory cell are located with equaldistances from each other in the plane parallel to the surface of thesubstrate.